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List of lectures

1 Structuring Simulation Software for SIMDALEE2
Wolfgang S.M. Werner
Lecture at the Simdalee2 cluster meeting, Nov. 22. 2014., Brno, Czech Republic,

2 Dielectric properties, correlation and screening in graphitic substances
Wolfgang Werner
ECOSS 30, Sept 5, 2014 Antalya (Tr)

3 Secondary Electron Electron Energy Loss Coincidence Spectroscopy (SE2ELCS) ofAluminum and various Carbon Allotropes
Alessandra Bellissimo, Wolfgang Werner
Poster at the International Workshop on Photoemission and Resonant Inelastic X-ray Scattering (IWPRIXS) Sept. 1st, 2014 Erice, (I)

4 sp2-content of carbon allotropes: a comparative study using Raman- and Electron Spectroscopy
Alessandra Bellissimo, Wolfgang Werner, Maksymilian Chudzicki, Afshan Tasneem, Johannes Ofner and Bernhard Lendl
Poster at the yearly Raman spectroscopy workshop, TU Viena, april 25. 2014

5 Interpretation of Nanoparticle X-ray photoelectron intensities
Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, Annette Foelske-Schmitz and Cedric J. Powell
Lecture at the 16th European Conference on Applications of Surface and Interface Analysis (ECASIA’15)Granada, Spain. September 28th - October 1st, 2015

6 Secondary Electron Electron Energy Loss Coincidence Spectroscopy (SE2ELCS) of Aluminum and various Carbon Allotropes
Alessandra Bellissimo, Wolfgang Werner
Poster at the IWPRIXS Sept. 2014 Erice, Sicily

7 Secondary Electron Energy Loss Coincidence Spectroscopy
W.S.M. Werner
Seminar Lecture at the Solid State Physics Group, ETH Z|rich, January 14 2010

8 Report on the 47th IUVSTA Workshop `Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films
A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado,C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi,L. Kover, H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace,W. S. M. Werner and J. Wolstenholme
Surf.Interface Anal. 41(2009)840-857

9 Tribological properties of additives for water-based lubricants
A. Tomala, A. Karpinska, Krystallia Psychogyiopoulou, W.S.M. Werner, A. Olver, H. St\”ori
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

10 Round Robin Study On Data-Processing Algorithms for Angle-Resolved X-Ray Photoelectron Spectroscopy. (VAMAS Surface Analysis Project A11)
G. Tasneem, W. Werner, W. Smekal, C.J. Powell
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

11 REELS of the aluminum
P. Jiricek, I. Bartos, J. Zemek and W.S.M. Werner
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

12 Round Robin Study On Data-Processing Algorithms for Angle-Resolved X-Ray Photoelectron Spectroscopy. (VAMAS Surface Analysis Project A11)
G. Tasneem, W. Werner, W. Smekal, C.J. Powell
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

13 Effects of Elastic Scattering and Analyzer-Acceptance Angle on the Analysis of Angle-Resolved XPS Data
C.J. Powell, W.S.M. Werner, and W. Smekal
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

14 Measurements and ab-initio calculations of the electron inelastic mean free path (IMFP) of 20 materials
W.S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

15 Photoelectron Angular Distributions of 5 Elemental Solids
C. Tomastik, J. Brenner, G. Tasneem, S. Gerhold, W. Smekal, W.S.M. Werner, and C.J. Powell
Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009

16 Highlights of the field of electron spectroscopy in the group surface and plasma technology
W.S.M. Werner
Vortrag am IAP seminar am 17.01.2007

17 Optical constants of solids measured with Reflection Electron Energy Loss spectroscopy (REELS)
W. S. M. Werner
Lecture at the European Conference on Applications of Surface and Interface Analysis ECASIA07, september 2-25, 2007, Brussels

18 Is Surface Roughness Important in Elastic Peak Electron Spectroscopy?
K. Olejnik, J. Zemek and W. S. M. Werner
11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic

19 Correlated Ion Induced Electron Emission from Solid Surfaces
W Smekal, W S M Werner, H St\”ori and HP Winter
11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic

20 Optical Constants of Solids Measured with Reflection Electron Energy Loss Spectroscopy (REELS)
W. S. M. Werner
11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic

21 Electron Transport Processes for Surface Analysis
W. S. M. Werner
Tutorial Lecture, Workshop “Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B)

22 NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA)
W. S. M. Werner, W. Smekal and C. J. Powell
Lecture, Workshop “Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B)

23 Partial Intensity Analysis for Quantitative Interpretation of Surface Electron Spectra.
W. S. M. Werner
Invited Lecture, Workshop “Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B)

24 NIST databases with parameters describing electron transport in solids
C. J. Powell, A. Jablonski, W. S. M. Werner, and W. Smekal
lecture at th the 8th International School and Symposium on Synchrotron Radiation in Natural Science, 12-17 June 2006, Zakopane (Poland)

25 Surface Excitations for Electron Spectroscopy
W.S.M Werner
Seminar Lecture presented at the Instituto Balseiro and Centro Atomico in Bariloche (Argentina) on 22.02.2006

26 Electron beam techniques for surface analysis
W.S.M Werner
Class presented at the Instituto Balseiro and Centro Atomico in Bariloche (Argentina) on 21.2.2006, 22.02.2006 and 23.02.2006

27 Film thickness determination of ultra thin HfO2 dielectrics with angle resolved XPS: Experimental electron scattering data
W.S.M. Werner, C. Tomastik, W. Smekal, D.W. Moon. K.J. Kim and C.J. Powell
Americam Vacuum Symposium 2006, San Francisco (US), 15 Nov 2006

28 Surface Sensitivity of Electron Spectroscopy Techniques- Status-Quo and Perspectives
W.S.M. Werner
Seminar lecture held at Universita di Roma Tre, 14 Nov 2006

29 Emission depth selectivity with Auger-Photoelectron coincidence spectroscopy
G. Stefani, A. Ruocco, F. Offi, R. Gotter, A. Morgante and F. TommasiniW.S.M Werner, W. Smekal, H. St\”ori, HP. Winter
Matter Materials and Devices Meeting, Genova/I, 23.6.2005

30 Measurement of Thicknesses of HfO2, HfSiO4, ZrO2, and ZrSiO4 Films on Silicon by Angle-Resolved XPS
W. Smekal W. S. M. Werner and C. J. Powell
AVS Symposium Boston, October 30-November 4, October 31

31 A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 films on silicon
Cedric J. Powell, Werner Smekal and Wolfgang S.M. Werner
Characterization and Metrology for ULSI Technology 2005, Richardson Texas, 15-18 March 2005, 16 March

32 Simulation of Electron Spectra for Surface Analysis (SESSA)
Wolfgang S.M. Werner, Werner Smekal and Cedric J. Powell
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

33 Non destructive depth-profiling with Auger-photoelectron coincidence spectroscopy
W. S. M. Werner, W. Smekal, H. St\”ori, H. Winter, G. Stefani, A. Ruocco, F. Offi, R. Gotter, A. Morgante and F. Tommasini
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

34 Intrinsic and extrinsic losses in deep core photoelectron and Auger spectra of solid Ge and Si
L. Kˆver, M. Novak, S. Egri, I. Cserny, Z. Berenyi, J. Toth, J. VÈgh, D. Varga, W. Drube, F. Yubero, S. Tougaard, W. S. M. Werner
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

35 Measurement of Thicknesses of HfO2, HfSiO4, ZrO2, and ZrSiO4 Films on Silicon by Angle-Resolved XPS
W. Smekal, W. S. M. Werner, and C. J. Powell
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

36 Differential surface and volume excitation probability and photoelectron source functions of Cu, CuO and Cu2O
Wolfgang S.M. Werner, Josef Zemek, and Petr Jiricek
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

37 Angular-resolved elastic peak electron spectroscopy. Experiment, analytical and Monte Carlo calculations.
Zemek J., Jiricek P., Werner W.S.M., Lesiak B., and Jablonski A.
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

38 Influence of surface roughness on elastic peak electron spectra
Olejnik K., Werner W.S.M., and Zemek J.
Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005

39 Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
Practical Surface Analysis 04 (PSA-04), Jeju/Korea, 6.10.2004 (Poster)

40 Trajectory Reversal Approach to Quasi-Elastic Electron Backscattering from Solid Surfaces
W.S.M. Werner
Practical Surface Analysis 04 (PSA-04), Jeju/Korea, 6.10.2004 (Poster)

41 Modeling of Electron Transport in AES and XPS
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
Workshop on Electron Scattering in Solids: From Fundamental Concepts to PracticalApplications (IUVSTA), Debrecen/H, 7.7.2004

42 Simulation of electron spectra for surface analysis I: physical data and physical model
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
Workshop on Electron Scattering in Solids: From Fundamental Concepts to PracticalApplications (IUVSTA), Debrecen/H, 5.7.2004

43 Simulation of electron spectra for surface analysis
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
17th Symp. on Surface Science (3S '04), St. Christoph am Arlberg/Tirol, 29.2. - 6.3.2004(Poster)

44 Surface and bulk plasmon coupling observed in reflection electron energy loss spectra
W.S.M. Werner
17th Symp. on Surface Science (3S '04), St. Christoph am Arlberg/Tirol, 29.2. - 6.3.2004(Poster)

45 Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 10.10.2003

46 Obtaining Quantitative Information on Surface Excitations from Reflection Electron Energy LossSpectra (REELS)
W.S.M. Werner
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 9.10.2003

47 Software Demonstration: Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003

48 Simulation of electron spectra for surface analysis
W.S.M. Werner (gem. mit. W. Smekal und C.J. Powell)
Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003 (Poster)

49 Scattering angle dependence of the surface excitation probability in reflection electron energy lossspectra
W.S.M. Werner (gem. mit C. Eisenmenger-Sittner, J. Zemek und P. Jiricek)
Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003(Poster)

50 Wechselwirkung schneller Elektronen mit Festkˆrperoberfl‰chen
W.S.M. Werner
Firma Ion Micro Systems (IMS), Wien, 18.2 2003

51 Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 10.10.2003

52 Obtaining Quantitative Information on Surface Excitations from Reflection Electron Energy LossSpectra (REELS)
Wolfgang S.M. Werner
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 9.10.2003

53 Software Demonstration: Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003

54 Simulation of electron spectra for surface analysisInt. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003
W.S.M. Werner (gem. mit. W. Smekal und C.J. Powell)
Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003

55 Scattering angle dependence of the surface excitation probability in reflection electron energy lossspectra
W.S.M. Werner (gem. mit C. Eisenmenger-Sittner, J. Zemek und P. Jiricek)
Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003

56 Wechselwirkung schneller Elektronen mit Festkˆrperoberfl‰chen
Wolfgang S.M. Werner
Firma Ion Micro Systems (IMS), Wien, 18.2 2003

57 Charakterisierung von monomolekularen Schmierstofffilmen
H. St\”ori (gem. mit R. Kolm, L. Vokovic und W.S.M. Werner)
Zuverl‰ssige Tribosysteme, Jahrestagung der ÷sterr. Tribologischen Gesellschaft, Schwechat,20.11.2003

58 Influence of coherent scattering (diffraction) on the Depth Distribution Function (DDF) in XPS/AESon polycrystalline surfaces
W. Smekal (gem. mit W.S.M. Werner, C.S. Fadley und M.A. van Hove)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003

59 Surface sensitivity in electron spectroscopy: coherent vs incoherent scattering models
W. Smekal (gem. mit W.S.M. Werner, C.S. Fadley und M.A. van Hove)
Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003

60 Measurement of the C 1s electron mean free path in octadecylsiloxane thin films on siliconby means of angle resolved XPS
R. Kolm (gem. mit J. Foisner, G. Friedbacher, R. Kleiner, W.S.M. Werner und H. St\”ori)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003

61 In situ XPS measurements of electrochemically prepared thin films
C. Jogl (gem. mit W.S.M. Werner und H. St\”ori)
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 8.10.2003

62 ESCA study of ultrathin lubricant layers
I.C. Gebeshuber (gem. mit R. Kolm, R. Kleiner, A. Ecker, W.S.M. Werner und H. St\”ori)
Tribology in Microsystems (TRIMIS 2003), Neuchatel/CH, 2.6.2003

63 C. Forsich, J. Laimer (gem. mit A. Bonanni, K. Hingerl, D. Stifter, J. Brenner, W.S.M. Wernerund H. St\”ori)In-situ spectroscopic ellipsometry as sensor for hard coating and steel nitriding
C. Forsich, J. Laimer (gem. mit A. Bonanni, K. Hingerl, D. Stifter, J. Brenner, W.S.M. Wernerund H. St\”ori)
3rd Int. Conf. on Spectroscopic Ellipsometry (ICSE-3), Wien, 8.7.2003

64 Quantitative surface analysis: influence of electron transport
Wolfgang S.M. Werner
Quantitative surface analysis: influence of electron transportSeminarvortrag, Instituto de Ciencia de Materiales de Sevilla, Sevilla/S, 14.11.2002

65 Partial Intensity Analysis: a universal method for elimination of multiple scattering fromelectron spectra
Wolfgang S.M. Werner
Workshop: XPS- from data to results, St. Malo/F, 23.4.2002

66 Simulation of Electron Spectra for Surface Analysis (SESSA)
W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
Workshop: XPS- from data to results, St. Malo/F, 23.4.2002

67 The role of surface excitations in quantitative electron spectroscopy
Wolfgang S.M. Werner
Symp. on Surface Science 2002 (3S'02), St. Christoph am Arlberg/Tirol, 6.3.2002

68 Elektronenspektroskopie tribologischer Oberfl‰chen
H. St\”ori und W.S.M. Werner
Tagung der ˆsterr. Tribologischen Gesellschaft, Wiener Neustadt/N÷, 28.11.2002

69 Quantitative Analysis of surface electron spectra
Wolfgang S.M. Werner
Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 27.11.2001

70 Electron transport in solids for quantitative surface analysis
Wolfgang S.M. Werner
Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 22.11.2001

71 Principles of electron spectroscopy on solid surfaces
Wolfgang S.M. Werner
Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 15.11.2001

72 Surface excitations in quantitative electron spectroscopy
Wolfgang S.M. Werner
American Vacuum Symp. (AVS), San Fransisco, California/USA, 29.10.2001

73 DBQUEST: a Database for Quantitative Electron Spectroscopy
Wolfgang S.M. Werner
Seminarvortrag, US National Institute for Standards and Technology (NIST), Gaithersburg,Maryland/USA, 23.10.2001

74 Surface excitations in Auger electron spectroscopy
W.S.M. Werner (gem. mit J. Brenner, H. Tratnik und H. St\”ori)
9th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA), Avignon/F, 1.10.2001

75 Quantitative Elektronenspektroskopie nicht-kristalliner Festk\”orperoberfl\”achen
Wolfgang S.M. Werner
Seminarvortrag, Universit‰t Freiburg/D, 19.1.2001

76 Quantitative Elektronenspektroskopie an Festkˆrperoberfl‰chen
Wolfgang S.M. Werner
Seminarvortrag, Institut f¸r Festkˆrper- und Werkstoffanalytik (IFW), Dresden/D, 5.7.2001

77 Progress and Problems in Quantitative Electron Spectroscopy
Wolfgang S.M. Werner
Seminarvortrag, Institut f¸r Theoretische Physik, TU Wien, 28.6.2001

78 Inelastische mittlere freie Wegl‰nge von Elektronen im mittleren Energiebereich in Ti, TiC,TiN, TiO2 and TiSi2
C. Tomastik (gem. mit J. Brenner, W.S.M. Werner und H. St\”ori)
51. Jahrestagung der ÷sterr. Physikalische Gesellschaft (÷PG), TU Wien, 17. - 21.9.2001

79 Electron Inelastic Mean Free Path (IMFP) for Medium Energy Electrons in Ti, TiC, TiN, TiO2and TiSi2
H. St\”ori (gem mit C. Tomastik, J. Brenner und W.S.M. Werner)
15th Int. Plansee Seminar, Reutte/Tirol, 28.5. - 1.6.2001

80 Dielectric relaxation and charge transport mechanism in (Ba,Sr)TiO3 thin films
G. Steinlesberger (gem. mit H. Reisinger, H. Bachhofer, H. Schroeder und W. Werner)
Int. Symp. on Integrated Ferroelectrics (ISIF 2001), Colorado Springs/USA, 12.3.2001

81 The 3-Step Model in Electron Spectroscopy Revised I: Escape of Auger Electrons fromNon-Crystalline Al, Si and Cu Surfaces
J. Brenner (gem. mit W.S.M. Werner, H. Tratnik und H. St\”ori)
7th Europ. Vacuum Conf. and 3rd Europ. Topical Conf. on Hard Coatings (EVC-7/ETCHC-3),Madrid/Spanien, 18.9.2001

82 On line shape analysis in X-ray photoelectron spectroscopy (XPS)
W.S.M. Werner (gem. mit Th. Cabela, J. Zemek und P. Jiricek)
8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA, 11.8.2000

83 Elastic electron reflection for determination of the inelastic mean free path (IMFP) of mediumenergy electrons in 24 elemental solids for energies between 50 and 3400 eV
Ch. Tomastik (gem. mit W.S.M. Werner, Th. Cabela, G. Richter und H. St\”ori)
8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA, 8. - 12.8.2000

84 Angular distribution of surface excitations for electrons backscattered from Al and Si surfaces
W. Smekal (gem. mit W.S.M. Werner, Th. Cabela, Ch. Eisenmenger-Sittner and H.St\”ori)
8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA,8. - 12.8.2000

85 Adaptive deconvolution of Auger electron spectra
J. Brenner (gem. mit Ch. Tomastik, W.S.M. Werner und H. St\”ori)
8th Joint Vacuum Conf. of Croatia, Austria, Slovenia and Hungary (JVC-8), Pula/Kroatien,4. - 8.6.2000

86 Auger Voltage Contrast (AVC) for two-dimensional junction delineation
Wolfgang S.M. Werner
Asian Pacific Conf. on Surface and Interface Analysis, Singapore, 8.12.1998

87 Inverse Modellierung in der Elektronenstrahl-Mikroanalyse
H.W. Wagner, W.S.M. Werner (gem. mit H. St\”ori)
48. Jahrestagung der ÷sterr. Physikalischen Gesellschaft (÷PG), Graz, 16.9.1998

88 Experimente zur Ermittlung der Austrittwahrscheinlichkeit der Elektronen bei TEY
H. Ebel, R.Svagera, M.F. Ebel, W.S.M.Werner and M. LIndner.
47 Jahrestagung der ˜PG, Wien, ˜sterreich, September 1997

89 Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.
W.S.M.Werner, H.Lakatha,H.Smith, L.LeTarte,V.Ambrose and J. Baker.
Workshop on 2-D Dopant Profiling, Triangle Research Park, NC, USA, April 1997.

90 Transport geladener Teilchen in Festkˆrpern
Wolfgang S.M. Werner
Seminarvortrag, Gesellschaft f¸r Strahlenforschung, Oberschleiflheim/D, 17.12.1997

91 Quantitation of Electron Spectroscopic Techniques
Wolfgang S.M. Werner
Seminarvortrag, National Institute of Standards and Technology (NIST), Gaithersburg/USA,10.11.1997

92 Transport of Electrons in Solids for Quantitative Surface Analysis
Wolfgang S.M. Werner
Seminarvortrag, Lawrence Berkely Lab. for Materials Science, Berkeley/USA, 3.11.1997

93 Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.
W.S.M.Werner.
AVS Symposium, Philadelphia, US, Nov 1996.

94 Selfconsistent Calibration of TixC1-x Auger spectra.
P.M.J.Schm\”olz, W.S.M.Werner, H. Wagner, H.S\”ori and J. Kiefer.
AVS Symposium, Philadelphia, US, Nov 1996.

95 High Precision Determination of Layer Thicknesses by XRF, EPMA, TEY and AAS.
J. Wernisch, H. Ebel, R. Svagera, R. Kaufmann, N. Zagler, N. Kugler, H. Nguyen, M. Mantler and W.S.M.Werner.
AAXA Sydney 96, Sydney, Australia,Jan. 1996

96 A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.
H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner, H.St\”ori and M.Gr\”oschl.
European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995

97 Separation of the Contribution of n-fold Inelastically Scattered Electrons fromAuger Spectra of Thin Gold Films on Platinum.
W.S.M.Werner.
European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995.

98 Efficient Calculation of Photoelectron Angular Distribution.
W.S.M.Werner, I.S.Tilinin and A.Jablonski.
European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995.

99 Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.
W.S.M.Werner.
European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995.

100 Comparison of simulated and experimental Auger intensities of Au, Pt, Ni and Si in absolute units.
H.Wagner, C.Schiebl and W.S.M.Werner.
4th European Microbeam Analysis Workshop (EMAS), St. Malo, France, 1995.

101 Monte Carlo simulation of electron scattering for arbitrary 2D structures using a modified quadtree geometry discretization.
H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.
4th European Microbeam Analysis Workshop (EMAS), St. Malo, France, 1995.

102 Comparison of Angle Resolved XPS and AES with Depth Profile Restoration from Inelastic Background Analysis
W.S.M.Werner and I.S.Tilinin.
40th Symposium of the American Vacuum Society (AVS), Orlando, Florida, USA, 1993.

103 Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra (REELS) of polycrystalline Al, Ni, Pt and Au.
W.S.M.Werner and M.Hayek
European Conference on Applied Surface and Interface Analysis (ECASIA), Catania, Italy, 1993.

104 Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and Al determined by Elastic Peak Electron Spectroscopy.
H.Beilschmidt, I.S.Tilinin and W.S.M.Werner
European Conference on Applied Surface and Interface Analysis (ECASIA), Catania, Italy, 1993

105 Relevance of Transport Processes for AES and XPS: Generalized Radiative FieldSimilarity Principle.
W.S.M.Werner and I.S.Tilinin,
8th International Vacuum Congress, (IVC), The Hague, The Netherlands, 1992

106 New Formalism for Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.
W.S.M.Werner and H.St\”ori.
European Conference on Applied Surface and Interface Analysis (ECASIA), Budapest, Hungary, 1991.

107 Electron Attenuation Data for 45 Elements.
W.S.M.Werner.
3rd European Vacuum Congress (EVC), Vienna, Austria.

108 On the Influence of Elastic Scattering on X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).
W.S.M.Werner.
Symposium on Surface Science (3S), Obertraun, Austria, 1991

109 On the Effect of Elastic Scattering on the Attenuation of Auger and Photoelectrons in Films with thin Overlayers.
W.S.M.Werner
European Conference on Surface Science (ECOSS), Salamanca, Spain, 1990

spt/group/werner/list_of_lectures.txt · Last modified: 2017-01-12 15:45 by Wolfgang Werner