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Book of Abstracts

Download a softcopy version of the Book of Abstracts here

Oral Presentations have a duration of 15 min including discussion

Invited lectures have a duration of 30 min including discussion

The size of the posters for a poster presentation is A0

IUVSTA71 List of Invited Speakers

Hagai Cohen Weizmann Institute of Science, Rehovot, Israel
Near and far-field spectroscopy at the nano-scale using focused electron beams
Christian Colliex Université Paris Sud, Orsay, France
Mapping the surface structural and electronic properties of individual nanoparticles with the tiny beam of a Scanning Transmission Electron Microscope (STEM)
Don Baer Environmental Molecular Sciences Laboratory, Richland, USA
Dave Castner University of Washington Seattle, USA
Nanoparticles in Biomedical Applications: Characterization Challenges, Opportunities and Recent Advances
Shigeo Tanuma National Institute for Materials Science, Tsukuba, Japan
Calculations of Electron Inelastic Mean Free Paths in Solids Over the 50 eV to 30 keV Range with Relativistic Full Penn Algorithm
Rafael Garcia-Molina Universidad de Murcia, Murcia, Spain
Inelastic scattering of proton beams in biological materials
Cesc Salvat-Pujol J.W.Goethe-Universität, Frankfurt/Main, Germany
Surface excitations in electron spectroscopy
Zhe-Jun Ding University of Science and Technology of China, Hefei, China
Roughness effect on electron spectrum
Cesc Salvat Gavalda Universitat de Barcelona, Barcelona, Spain
Laszlo Kover Institute of Nuclear Research of the Hungarian Academy of Sciences (ATOMKI) Debrecen, Hungary
Intrinsic and surface excitations in XPS/HAXPES
Wolfgang Drube Deutsches Elektronen-Synchrotron, Hamburg Germany
Electronic characterization of nano-structured materials by HAXPES
Chuck Fadley Department of Physics University of California Davis, USA
Characterization of Nanostructures with Hard X-Ray Photoemission
Alex Shard National Physical Laboratory, Teddington, UK
Practical XPS Analysis of Nanoparticles
Hideki Yoshikawa National Institute for Materials Science, Tsukuba, , Japan
Energy loss functions and IMFPs derived by factor analysis of reflection electron energy loss spectra
Kyung-Joong Kim Korea Research Institute of Standards and Science, Yuseong-gu, Rep. of Korea
Traceable Thickness Measurement of nm Oxide Films by XPS
Alex Jablonski Polish academy of sciences, Warsaw, Poland
Quantification of XPS Analysis of Stratified Samples
David Liljequist Sweden
Maurizio Dapor Fondazione Bruno Kessler, Trento, Italy
Monte Carlo simulation of secondary electron emission in the low-energy domain

Download the preliminary program here

iuvsta71/program.txt · Last modified: 2013-09-18 15:23 by Wolfgang Werner