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surface:room-temperature_stm [2009-03-02 13:27]
127.0.0.1 external edit
surface:room-temperature_stm [2009-03-04 19:24] (current)
Michael Schmid + image of stm head
Line 6: Line 6:
Besides the STM, the //analysis chamber// also features a hemispherical analyzer for XPS (x-ray photoelectron spectroscopy) and LEIS (low-energy ion scattering), a cylindrical mirror analyzer with coaxial electron source for AES (Auger electron spectroscopy) and LEED optics (low-energy electron diffraction). The //preparation chamber// is equipped with an ion source for sputtering, three electron-beam evaporators, a retractable gas doser with a microcapillary plate and a gas cracker for atomic oxygen or hydrogen. Sample heaters (electron bombardment of the sample plate, up to 1200 °C) are available in both chambers. Besides the STM, the //analysis chamber// also features a hemispherical analyzer for XPS (x-ray photoelectron spectroscopy) and LEIS (low-energy ion scattering), a cylindrical mirror analyzer with coaxial electron source for AES (Auger electron spectroscopy) and LEED optics (low-energy electron diffraction). The //preparation chamber// is equipped with an ion source for sputtering, three electron-beam evaporators, a retractable gas doser with a microcapillary plate and a gas cracker for atomic oxygen or hydrogen. Sample heaters (electron bombardment of the sample plate, up to 1200 °C) are available in both chambers.
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 +{{:surface:rt-stm_head.jpg?180 |The core of the RT STM: tip and sample}}
surface/room-temperature_stm.txt · Last modified: 2009-03-04 19:24 by Michael Schmid