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spt:research:xy [2017-01-12 14:23]
Wolfgang Werner created
spt:research:xy [2017-01-12 15:37] (current)
Wolfgang Werner
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-ddd+===== List of Publications of Wolfgang S.M. Werner ===== 
 +1 **  
 +Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 22730−22738  
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 +2 **  
 +Correction to "Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 2484 84  
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 +3 **  
 +Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate  
 +**\\  
 +Wolfgang S.M. Werner  , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui   
 +\\ // 
 +Surface Science 635 (2015) L1–L3  
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 +4 **  
 +Physics-based Simulation Models for EBSD: Advances and Challenges  
 +**\\  
 +Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner  
 +\\ // 
 +arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015  
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 +5 **  
 +Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2015, 119, 17687  
 +\\   
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 +6 **  
 +Interpretation of nanoparticle X-ray photoelectron intensities  
 +**\\  
 +Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell  
 +\\ // 
 +Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065  
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 +7 **  
 +In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al  
 +**\\  
 +Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek  
 +\\ // 
 +PHYSICAL REVIEW B 89, 205435 (2014)  
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 +8 **  
 +Interlaboratory study comparing anylses of simulated angle resolved XP Spectra  
 +**\\  
 +Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal  and Cedric J. Powell  
 +\\ // 
 +Surf. Interf. Anal 46, (2014) 321   
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 +9 **  
 +Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing  
 +**\\  
 +D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. (2014)  
 +\\   
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 +10 **  
 +SiON metrology using angular and energy distributions of photoelectrons  
 +**\\  
 +G Tasneem, C Tomastik, R Mroczynski and W S M Werner  
 +\\ // 
 +Journal of Physics: Conference Series 439 (2013) 012005  
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 +11 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials  
 +**\\  
 +Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628  
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 +12 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities  
 +**\\  
 +Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214  
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 +13 **  
 +Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface  
 +**\\  
 +Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani  
 +\\ // 
 +PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407  
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 +14 **  
 +Electron Supersurface Scattering On Polycrystalline Au  
 +**\\  
 +Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110  
 +\\   
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 +15 **  
 +Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm  
 +**\\  
 +F. Salvat-Pujol and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175  
 +\\   
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 +16 **  
 +Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)  
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007  
 +\\   
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 +17 **  
 +In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface  
 +**\\  
 +J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner  
 +\\ // 
 +Surf. Interface Anal. (2013) DOI 10.1002/sia.5331  
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 +18 **  
 +Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric  
 +**\\  
 +O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli  
 +\\ // 
 +Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094  
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 +19 **  
 +Angular dependence of electron induced surface plasmon excitation                                                                   
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner  
 +\\ // 
 +APL 98(2011)193111  
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 +20 **  
 +Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy  
 +**\\  
 +F. Salvat-Pujol* and W. S. M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416  
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 +21 **  
 +Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations  
 +**\\  
 +G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. (2010)  
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 +22 **  
 +Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data  
 +**\\  
 +G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. 42(2010)1072  
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 +23 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +W.S.M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B82(2010)155422  
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 +24 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +W.S.M. Werner   
 +\\ // 
 +J. Elec. Spec. Rel. Phen. 178-179(2010)154-177  
 +\\   
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 +25 **  
 +Reflection electron energy loss spectroscopy of aluminum   
 +**\\  
 +P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 1006-1009  
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 +26 **  
 +Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 604 (2010) 290-299  
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 +27 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PHYSICAL REVIEW B 82, 155422  2010 DOI: 10.1103/PhysRevB.82.155422  
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 +28 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004  
 +\\   
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 +29 **  
 +Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019  
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 +30 **  
 +Optical constants and inelastic electron-scattering data for 17 elemental metals  
 +**\\  
 +Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092  
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 +31 **  
 +Richardson - Lucy deconvolution of reflection electron energy loss spectra   
 +**\\  
 +Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. (2009)  
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 +32 **  
 +Report on the 47th IUVSTA Workshop "Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films"  
 +**\\  
 +A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\"over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme  
 +\\ // 
 +Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105  
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 +33 **  
 +Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals  
 +**\\  
 +Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009  doi:10.1063/1.3243762   
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 +34 **  
 +Role of surface and bulk plasmon decay in secondary electron emission   
 +**\\  
 +Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani  
 +\\ // 
 +Phys. Rev. B 78 (2008)233403  
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 +35 **  
 +Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra   
 +**\\  
 +M.R. Went  M. Vos a, W.S.M. Werner   
 +\\ // 
 +Surf. Sci. 602(2008)2069-2077  
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 +36 **  
 +Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths  
 +**\\  
 +Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +Phys. Rev. B 77, R161404 (2008)  
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 +37 **  
 +Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 601 (2007) 2125-2138  
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 +38 **  
 +Photon and electron induced electron emission from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Cahpter 2 In "Slow Heavy Particle Induced Electron Emission from Solid Surfaces", Springer Tracts in Modern Physics 225  
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 +39 **  
 +Energy dependence of electron energy loss processesin Ge 2s photoemission  
 +**\\  
 +M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 601(2007)2344  
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 +40 **  
 +Comparison of hard and soft x-ray photoelectron spectra of silicon  
 +**\\  
 +F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione  
 +\\ // 
 +Phys. Rev. B76(2007)085422  
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 +41 **  
 +Surface plasmon excitation at a Au surface by 15040,000 eV electrons  
 +**\\  
 +Wolfgang S.M. Werner, Michael R. Went, Maarten Vos  
 +\\ // 
 +Surf. Sci.  601(2007)L109  
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 +42 **  
 +Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, and W. Smekal  
 +\\ // 
 +Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula  
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 +43 **  
 +Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria  
 +**\\  
 +Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\"udenauer and John F. Watts  
 +\\ // 
 +Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421  
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 +44 **  
 +Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 252116  (2006)   
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 +45 **  
 +Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 213106  (2006)   
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 +46 **  
 +Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 172101  (2006)   
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 +47 **  
 +Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 600(2006)L250-254  
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 +48 **  
 +Differential surface and volume excitation probability of medium-energy electrons in solids.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Phys. Rev. B 74(2006) 075421   
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 +49 **  
 +Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations  
 +**\\  
 +J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski  
 +\\ // 
 +Surf. Interf. Anal.38(2006)615  
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 +50 **  
 +Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O  
 +**\\  
 +W. S. M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)628  
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 +51 **  
 +Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge  
 +**\\  
 +L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)569  
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 +52 **  
 +EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY  
 +**\\  
 +W.S.M. Werner, W. Smekal, H. St\"ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini  
 +\\ // 
 +Elletra research highlights 2004-2005  
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 +53 **  
 +Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR  
 +**\\  
 +Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\"ori H  
 +\\ // 
 +Life Cycle Tribology 48(2005)  269-282  
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 +54 **  
 +Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal  
 +\\ // 
 +Applied Surface Science 239 (2005) 470-480  
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 +55 **  
 +On the energy dissipation process in incoherent electron scattering  
 +**\\  
 +Wolfgang S.M. Werner, Peter Schattschneider  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80  
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 +56 **  
 +Oxidation of beryllium: a scanningAuger investigation  
 +**\\  
 +C. Tomastik,W. Werner and H. St\"ori  
 +\\ // 
 +Nucl. Fusion 45 (2005) 1061-1065  
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 +57 **  
 +Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini  
 +\\ // 
 +Phys. Rev. Lett. 94 (2005) 038302  
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 +58 **  
 +A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon  
 +**\\  
 +C.J. Powell, W. Smekal and W.S.M. Werner  
 +\\ // 
 +Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005   
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 +59 **  
 +Angular-resolved photoelectron spectroscopyof corrugated surfaces  
 +**\\  
 +K. Olejnik, J. Zemek and W.S.M. Werner  
 +\\ // 
 +Surface Science 595 (2005) 212-222  
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 +60 **  
 +Coherence in electron energy loss spectrometry  
 +**\\  
 +P. Schattschneider and W.S.M. Werner  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95  
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 +  
 +61 **  
 +Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy  
 +**\\  
 +Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 1059-1067  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +62 **  
 +Trajectory reversal approach for electron backscattering from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 71, 115415 (2005)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +63 **  
 +Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 846-860  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +64 **  
 +Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces  
 +**\\  
 +Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga  
 +\\ // 
 +Surface Science 585 (2005) 85-94  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +65 **  
 +Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 588 (2005) 26-40  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +66 **  
 +Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy  
 +**\\  
 +G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\"ori D.L. Beke  
 +\\ // 
 +Thin Solid Films 459 (2004) 303-307  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +67 **  
 +Quantitative surface analysis with electrons  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Applied Surface Science 235 (2004) 2-14  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +68 **  
 +Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models  
 +**\\  
 +W. Smekal, W.S.M. Werner, C.S. Fadley and  M.A. van Hove  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +69 **  
 +Electron Transport in Solids Chapter 10 in the book "Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy"  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +70 **  
 +Charakterisierung monomolekuarer Schmierstofffilme  
 +**\\  
 +R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\"ori  
 +\\ // 
 +in "Zuverl‰ssige Tribosysteme", Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +71 **  
 +Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.  
 +**\\  
 +W.S.M. Werner, C Eisenmenger--Sittner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B. 67(2003)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +72 **  
 +Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 35(2003)347  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +73 **  
 +Surface and bulk plasmon coupling observed in refelection electron energy loss spectra  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 526(2003)L159-L164  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +74 **  
 +Wannier-Stark States in Finite Superlattices  
 +**\\  
 +M. Kast, C. Pacher, G. Strasser, E. Gornikand  W.S.M. Werner  
 +\\ // 
 +Phys. Rev. Lett. 89(2002)136803  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +75 **  
 +Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni  
 +**\\  
 +L. Kñver, S. Tougaard,  W.S.M. Werner,  and I. Cserny  
 +\\ // 
 +Surf. Interf. Anal. 33(2002)681  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +76 **  
 +Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)  
 +**\\  
 +W.S.M. Werner,  H. St\"ori and HP. Winter  
 +\\ // 
 +Surf. Sci. 518(2002)L569  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +77 **  
 +Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of  Thin Cu and Ni Films   
 +**\\  
 +W.S.M. Werner,  L. Kñver, J. Toth and D. Varga  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  122(2002)103  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +78 **  
 +Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces  
 +**\\  
 +Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner  
 +\\ // 
 +J. Vac. Sci. Technol. A 19, Sep-Oct 2001  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +79 **  
 +Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons  Backscattered from Al and Si Surfaces.   
 +**\\  
 +W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Vac. Sci. Technol.  A19(2001)2388  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +80 **  
 +The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of  Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.   
 +**\\  
 +W.S.M.Werner, H. Tratnik, J. Brenner  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  495(2001)107  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +81 **  
 +Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces  
 +**\\  
 +W.S.M. Werner,  W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  114(2001)363  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +82 **  
 +Surface Excitation Probability  of Medium .Energy Electrons in Metals and  Semiconductors.   
 +**\\  
 +W.S.M.Werner, W. Smekal, C. Tomastik  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  486(2001)L461  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +83 **  
 +Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)141  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +84 **  
 +Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons  Backscattered from a Polycrystalline Au Surface  
 +**\\  
 +W.S.M.Werner, W. Smekal  and H. St\"ori   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)475  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +85 **  
 +Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental  Solids for Energies between 50 and 3400~eV.  
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  113(2001)127  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +86 **  
 +Electron Probe Microanalysis Inverse Modelling   
 +**\\  
 +H.W. Wagner, W.S.M.Werner, H. St\"ori and L. Richardson  
 +\\ // 
 +Nucl. Instr. Methods. Phys. Res.  B184(2001)450  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +87 **  
 +On Line Shape Analysis in X-ray Photoelectron spectroscopy   
 +**\\  
 +W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Sci.  470(2001)325  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +88 **  
 +Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.     
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +Surf. Sci.  470(2000)L123  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +89 **  
 +Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples   
 +**\\  
 +K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver  
 +\\ // 
 +Surf. Interf. Analysis 29(2000)126  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +90 **  
 +Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)386  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +91 **  
 +Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)380  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +92 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments  .   
 +**\\  
 +H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel   
 +\\ // 
 +Adv. X-ray Anal. 41(1999)367  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +93 **  
 +Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.   
 +**\\  
 +S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton  and B. Fricke   
 +\\ // 
 +Surf. Sci.  417(1998)372  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +94 **  
 +Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach  
 +**\\  
 +H. W. Wagner and W. S. M. Werner  
 +\\ // 
 +X-RAY SPECTROMETRY,27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +95 **  
 +Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.   
 +**\\  
 +P.M.J.Schm\"olz, W.S.M.Werner, H. Wagner, H.St\"ori and J. Kiefer.  
 +\\ // 
 +Surf. Interf. Anal, 26(1998)590   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +96 **  
 +Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal, 26(1998)455  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +97 **  
 +A New Method for the Calculation of Ionization Depth Distribution in EPMA  
 +**\\  
 +H. Wagner and W.S.M.Werner   
 +\\ // 
 +X-Ray Spectrometry, 27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +98 **  
 +Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.   
 +**\\  
 +W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte,  V. Ambrose and J. Baker   
 +\\ // 
 +J. Vac. Sci. and Technol., B16(1998)420   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +99 **  
 +Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J.Vac. Sci. Technol, A15(1997)465  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +100 **  
 +Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Jap. J. of Surface Anal., 3(1997)312  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +101 **  
 +Slowing Down of Medium Energy Electrons in Solids.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Phys. Rev., B55(1997)14925   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +102 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments   
 +**\\  
 +H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel  
 +\\ // 
 +Adv. x-Ray Analysis, in print   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +103 **  
 +Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy  
 +**\\  
 +I.S. Tilinin, A. Jablonski and W.S.M. Werner  
 +\\ // 
 +Progress in Surface Science 52(1996)193-335  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +104 **  
 +A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.   
 +**\\  
 +H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner,  H.St\"ori and M. Gr\"oschl  
 +\\ // 
 +Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +105 **  
 +Quantitative Surface Analysis by Means of AES.   
 +**\\  
 +I.S.Tilinin, A.Jablonski and W.S.M.Werner.   
 +\\ // 
 +Prog. Surf. Sci., 52(1996)193   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +106 **  
 +Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.   
 +**\\  
 +H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)533  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +107 **  
 +Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.   
 +**\\  
 +H.Wagner, C.Schiebl and W.S.M.Werner.  
 +\\ // 
 +Mikrochim. Act.,13(1996)623   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +108 **  
 +Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)13   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +109 **  
 +Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.   
 +**\\  
 +C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\"olz, W.S.M.Werner  and H.St\"ori.   
 +\\ // 
 +Vacuum 46(1995)1281  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +110 **  
 +Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.  
 +**\\  
 +W.S.M.Werner  
 +\\ // 
 +Surf. Interf. Anal., 23(1995)737   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +111 **  
 +Efficient Calculation of Photoelectron Angular Distribution.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin and A.Jablonski.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)823  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +112 **  
 +Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)696.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +113 **  
 +Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B52(1995)2964.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +114 **  
 +Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.  
 +**\\  
 +H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 22(1994)120   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +115 **  
 +Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra  of Polycrystalline Al, Ni, Pt and Au.  
 +**\\  
 +W.S.M.Werner and M.Hayek.  
 +\\ // 
 +Surf. Interf. Anal. 22(1994)79  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +116 **  
 +Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..   
 +**\\  
 +W.S.M.Werner, and I.S.Tilinin.   
 +\\ // 
 +J. Vac. Sci. Technol. A12(1994)2337.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +117 **  
 +Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.   
 +\\ // 
 +Surf. Interf. Anal. 21(1994)21  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +118 **  
 +Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.  
 +**\\  
 +W.S.M.Werner, M.Hayek and I.S.Tilinin.   
 +\\ // 
 +Phys. Rev. B50(1994)4819.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +119 **  
 +Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Prog. Surf. Sci. 46(1994)46.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +120 **  
 +New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act. 114/115(1994)485.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +121 **  
 +Reply to Comment on "Angular and Energy Distribution of Auger Electrons Emitted from  non-crystalline Targets" by V.M. Dwyer  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin .   
 +\\ // 
 +Surf. Sci. 304(1994)385.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +122 **  
 +The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\"ori and J.Barounig.   
 +\\ // 
 +Thin Solid Films 228(1993)56  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +123 **  
 +Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets  
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 290(1993)119.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +124 **  
 +Escape Probability of Auger and Photoelectrons from Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Appl. Surf. Sci. 70/71(1993)29.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +125 **  
 +Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\"ori and J.Barounig.   
 +\\ // 
 +Surface and Coatings Technology 54/55(1992)329   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +126 **  
 +Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent  XPS.  
 +**\\  
 +W.S.M.Werner, G.C.Smith and A.K.Livesey.  
 +\\ // 
 +Surf. Interf. Anal. 21(1992)38.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +127 **  
 +The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B46(1992)13739   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +128 **  
 +The Role of the Attenuation  Parameter in Electron Spectroscopy   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J. Electr.Spectrosc. Relat. Phen. 59(1992)275.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +129 **  
 +Attenuation of Electrons in Non-crystalline Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Surf. Sci. Lett. 268(1992)L319.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +130 **  
 +A new Formalism for  Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.   
 +**\\  
 +W.S.M.Werner and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal. 19(1992)83   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +131 **  
 +Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 18(1992)217.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +132 **  
 +Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.  
 +**\\  
 +W.S.M.Werner, W.H.Gries and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal.17(1991)693  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +133 **  
 +On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 257(1991)319   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +134 **  
 +Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 251/252(1991)336   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +135 **  
 +A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies   
 +**\\  
 +W.S.M.Werner, W.H.Gries and H. St\"ori   
 +\\ // 
 +J. Vac. Sci. Technol. A9(1991)21   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +136 **  
 +Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.  
 +**\\  
 +W.H.Gries and W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal. 16(1990)149   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +===== List of invited lectures ===== 
 +1 **  
 +Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 22730−22738  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +2 **  
 +Correction to "Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 2484 84  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +3 **  
 +Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate  
 +**\\  
 +Wolfgang S.M. Werner  , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui   
 +\\ // 
 +Surface Science 635 (2015) L1–L3  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +4 **  
 +Physics-based Simulation Models for EBSD: Advances and Challenges  
 +**\\  
 +Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner  
 +\\ // 
 +arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +5 **  
 +Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2015, 119, 17687  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +6 **  
 +Interpretation of nanoparticle X-ray photoelectron intensities  
 +**\\  
 +Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell  
 +\\ // 
 +Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +7 **  
 +In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al  
 +**\\  
 +Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek  
 +\\ // 
 +PHYSICAL REVIEW B 89, 205435 (2014)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +8 **  
 +Interlaboratory study comparing anylses of simulated angle resolved XP Spectra  
 +**\\  
 +Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal  and Cedric J. Powell  
 +\\ // 
 +Surf. Interf. Anal 46, (2014) 321   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +9 **  
 +Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing  
 +**\\  
 +D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. (2014)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +10 **  
 +SiON metrology using angular and energy distributions of photoelectrons  
 +**\\  
 +G Tasneem, C Tomastik, R Mroczynski and W S M Werner  
 +\\ // 
 +Journal of Physics: Conference Series 439 (2013) 012005  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +11 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials  
 +**\\  
 +Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +12 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities  
 +**\\  
 +Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +13 **  
 +Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface  
 +**\\  
 +Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani  
 +\\ // 
 +PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +14 **  
 +Electron Supersurface Scattering On Polycrystalline Au  
 +**\\  
 +Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +15 **  
 +Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm  
 +**\\  
 +F. Salvat-Pujol and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +16 **  
 +Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)  
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +17 **  
 +In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface  
 +**\\  
 +J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner  
 +\\ // 
 +Surf. Interface Anal. (2013) DOI 10.1002/sia.5331  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +18 **  
 +Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric  
 +**\\  
 +O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli  
 +\\ // 
 +Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +19 **  
 +Angular dependence of electron induced surface plasmon excitation                                                                   
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner  
 +\\ // 
 +APL 98(2011)193111  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +20 **  
 +Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy  
 +**\\  
 +F. Salvat-Pujol* and W. S. M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +21 **  
 +Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations  
 +**\\  
 +G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. (2010)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +22 **  
 +Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data  
 +**\\  
 +G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. 42(2010)1072  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +23 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +W.S.M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B82(2010)155422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +24 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +W.S.M. Werner   
 +\\ // 
 +J. Elec. Spec. Rel. Phen. 178-179(2010)154-177  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +25 **  
 +Reflection electron energy loss spectroscopy of aluminum   
 +**\\  
 +P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 1006-1009  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +26 **  
 +Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 604 (2010) 290-299  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +27 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PHYSICAL REVIEW B 82, 155422  2010 DOI: 10.1103/PhysRevB.82.155422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +28 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +29 **  
 +Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +30 **  
 +Optical constants and inelastic electron-scattering data for 17 elemental metals  
 +**\\  
 +Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +31 **  
 +Richardson - Lucy deconvolution of reflection electron energy loss spectra   
 +**\\  
 +Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. (2009)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +32 **  
 +Report on the 47th IUVSTA Workshop "Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films"  
 +**\\  
 +A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\"over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme  
 +\\ // 
 +Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +33 **  
 +Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals  
 +**\\  
 +Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009  doi:10.1063/1.3243762   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +34 **  
 +Role of surface and bulk plasmon decay in secondary electron emission   
 +**\\  
 +Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani  
 +\\ // 
 +Phys. Rev. B 78 (2008)233403  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +35 **  
 +Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra   
 +**\\  
 +M.R. Went  M. Vos a, W.S.M. Werner   
 +\\ // 
 +Surf. Sci. 602(2008)2069-2077  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +36 **  
 +Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths  
 +**\\  
 +Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +Phys. Rev. B 77, R161404 (2008)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +37 **  
 +Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 601 (2007) 2125-2138  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +38 **  
 +Photon and electron induced electron emission from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Cahpter 2 In "Slow Heavy Particle Induced Electron Emission from Solid Surfaces", Springer Tracts in Modern Physics 225  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +39 **  
 +Energy dependence of electron energy loss processesin Ge 2s photoemission  
 +**\\  
 +M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 601(2007)2344  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +40 **  
 +Comparison of hard and soft x-ray photoelectron spectra of silicon  
 +**\\  
 +F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione  
 +\\ // 
 +Phys. Rev. B76(2007)085422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +41 **  
 +Surface plasmon excitation at a Au surface by 15040,000 eV electrons  
 +**\\  
 +Wolfgang S.M. Werner, Michael R. Went, Maarten Vos  
 +\\ // 
 +Surf. Sci.  601(2007)L109  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +42 **  
 +Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, and W. Smekal  
 +\\ // 
 +Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +43 **  
 +Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria  
 +**\\  
 +Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\"udenauer and John F. Watts  
 +\\ // 
 +Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +44 **  
 +Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 252116  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +45 **  
 +Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 213106  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +46 **  
 +Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 172101  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +47 **  
 +Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 600(2006)L250-254  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +48 **  
 +Differential surface and volume excitation probability of medium-energy electrons in solids.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Phys. Rev. B 74(2006) 075421   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +49 **  
 +Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations  
 +**\\  
 +J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski  
 +\\ // 
 +Surf. Interf. Anal.38(2006)615  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +50 **  
 +Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O  
 +**\\  
 +W. S. M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)628  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +51 **  
 +Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge  
 +**\\  
 +L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)569  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +52 **  
 +EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY  
 +**\\  
 +W.S.M. Werner, W. Smekal, H. St\"ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini  
 +\\ // 
 +Elletra research highlights 2004-2005  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +53 **  
 +Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR  
 +**\\  
 +Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\"ori H  
 +\\ // 
 +Life Cycle Tribology 48(2005)  269-282  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +54 **  
 +Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal  
 +\\ // 
 +Applied Surface Science 239 (2005) 470-480  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +55 **  
 +On the energy dissipation process in incoherent electron scattering  
 +**\\  
 +Wolfgang S.M. Werner, Peter Schattschneider  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +56 **  
 +Oxidation of beryllium: a scanningAuger investigation  
 +**\\  
 +C. Tomastik,W. Werner and H. St\"ori  
 +\\ // 
 +Nucl. Fusion 45 (2005) 1061-1065  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +57 **  
 +Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini  
 +\\ // 
 +Phys. Rev. Lett. 94 (2005) 038302  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +58 **  
 +A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon  
 +**\\  
 +C.J. Powell, W. Smekal and W.S.M. Werner  
 +\\ // 
 +Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +59 **  
 +Angular-resolved photoelectron spectroscopyof corrugated surfaces  
 +**\\  
 +K. Olejnik, J. Zemek and W.S.M. Werner  
 +\\ // 
 +Surface Science 595 (2005) 212-222  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +60 **  
 +Coherence in electron energy loss spectrometry  
 +**\\  
 +P. Schattschneider and W.S.M. Werner  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +61 **  
 +Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy  
 +**\\  
 +Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 1059-1067  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +62 **  
 +Trajectory reversal approach for electron backscattering from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 71, 115415 (2005)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +63 **  
 +Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 846-860  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +64 **  
 +Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces  
 +**\\  
 +Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga  
 +\\ // 
 +Surface Science 585 (2005) 85-94  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +65 **  
 +Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 588 (2005) 26-40  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +66 **  
 +Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy  
 +**\\  
 +G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\"ori D.L. Beke  
 +\\ // 
 +Thin Solid Films 459 (2004) 303-307  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +67 **  
 +Quantitative surface analysis with electrons  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Applied Surface Science 235 (2004) 2-14  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +68 **  
 +Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models  
 +**\\  
 +W. Smekal, W.S.M. Werner, C.S. Fadley and  M.A. van Hove  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +69 **  
 +Electron Transport in Solids Chapter 10 in the book "Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy"  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +70 **  
 +Charakterisierung monomolekuarer Schmierstofffilme  
 +**\\  
 +R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\"ori  
 +\\ // 
 +in "Zuverl‰ssige Tribosysteme", Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +71 **  
 +Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.  
 +**\\  
 +W.S.M. Werner, C Eisenmenger--Sittner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B. 67(2003)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +72 **  
 +Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 35(2003)347  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +73 **  
 +Surface and bulk plasmon coupling observed in refelection electron energy loss spectra  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 526(2003)L159-L164  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +74 **  
 +Wannier-Stark States in Finite Superlattices  
 +**\\  
 +M. Kast, C. Pacher, G. Strasser, E. Gornikand  W.S.M. Werner  
 +\\ // 
 +Phys. Rev. Lett. 89(2002)136803  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +75 **  
 +Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni  
 +**\\  
 +L. Kñver, S. Tougaard,  W.S.M. Werner,  and I. Cserny  
 +\\ // 
 +Surf. Interf. Anal. 33(2002)681  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +76 **  
 +Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)  
 +**\\  
 +W.S.M. Werner,  H. St\"ori and HP. Winter  
 +\\ // 
 +Surf. Sci. 518(2002)L569  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +77 **  
 +Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of  Thin Cu and Ni Films   
 +**\\  
 +W.S.M. Werner,  L. Kñver, J. Toth and D. Varga  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  122(2002)103  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +78 **  
 +Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces  
 +**\\  
 +Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner  
 +\\ // 
 +J. Vac. Sci. Technol. A 19, Sep-Oct 2001  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +79 **  
 +Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons  Backscattered from Al and Si Surfaces.   
 +**\\  
 +W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Vac. Sci. Technol.  A19(2001)2388  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +80 **  
 +The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of  Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.   
 +**\\  
 +W.S.M.Werner, H. Tratnik, J. Brenner  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  495(2001)107  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +81 **  
 +Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces  
 +**\\  
 +W.S.M. Werner,  W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  114(2001)363  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +82 **  
 +Surface Excitation Probability  of Medium .Energy Electrons in Metals and  Semiconductors.   
 +**\\  
 +W.S.M.Werner, W. Smekal, C. Tomastik  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  486(2001)L461  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +83 **  
 +Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)141  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +84 **  
 +Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons  Backscattered from a Polycrystalline Au Surface  
 +**\\  
 +W.S.M.Werner, W. Smekal  and H. St\"ori   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)475  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +85 **  
 +Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental  Solids for Energies between 50 and 3400~eV.  
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  113(2001)127  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +86 **  
 +Electron Probe Microanalysis Inverse Modelling   
 +**\\  
 +H.W. Wagner, W.S.M.Werner, H. St\"ori and L. Richardson  
 +\\ // 
 +Nucl. Instr. Methods. Phys. Res.  B184(2001)450  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +87 **  
 +On Line Shape Analysis in X-ray Photoelectron spectroscopy   
 +**\\  
 +W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Sci.  470(2001)325  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +88 **  
 +Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.     
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +Surf. Sci.  470(2000)L123  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +89 **  
 +Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples   
 +**\\  
 +K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver  
 +\\ // 
 +Surf. Interf. Analysis 29(2000)126  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +90 **  
 +Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)386  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +91 **  
 +Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)380  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +92 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments  .   
 +**\\  
 +H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel   
 +\\ // 
 +Adv. X-ray Anal. 41(1999)367  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +93 **  
 +Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.   
 +**\\  
 +S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton  and B. Fricke   
 +\\ // 
 +Surf. Sci.  417(1998)372  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +94 **  
 +Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach  
 +**\\  
 +H. W. Wagner and W. S. M. Werner  
 +\\ // 
 +X-RAY SPECTROMETRY,27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +95 **  
 +Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.   
 +**\\  
 +P.M.J.Schm\"olz, W.S.M.Werner, H. Wagner, H.St\"ori and J. Kiefer.  
 +\\ // 
 +Surf. Interf. Anal, 26(1998)590   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +96 **  
 +Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal, 26(1998)455  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +97 **  
 +A New Method for the Calculation of Ionization Depth Distribution in EPMA  
 +**\\  
 +H. Wagner and W.S.M.Werner   
 +\\ // 
 +X-Ray Spectrometry, 27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +98 **  
 +Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.   
 +**\\  
 +W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte,  V. Ambrose and J. Baker   
 +\\ // 
 +J. Vac. Sci. and Technol., B16(1998)420   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +99 **  
 +Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J.Vac. Sci. Technol, A15(1997)465  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +100 **  
 +Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Jap. J. of Surface Anal., 3(1997)312  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +101 **  
 +Slowing Down of Medium Energy Electrons in Solids.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Phys. Rev., B55(1997)14925   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +102 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments   
 +**\\  
 +H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel  
 +\\ // 
 +Adv. x-Ray Analysis, in print   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +103 **  
 +Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy  
 +**\\  
 +I.S. Tilinin, A. Jablonski and W.S.M. Werner  
 +\\ // 
 +Progress in Surface Science 52(1996)193-335  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +104 **  
 +A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.   
 +**\\  
 +H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner,  H.St\"ori and M. Gr\"oschl  
 +\\ // 
 +Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +105 **  
 +Quantitative Surface Analysis by Means of AES.   
 +**\\  
 +I.S.Tilinin, A.Jablonski and W.S.M.Werner.   
 +\\ // 
 +Prog. Surf. Sci., 52(1996)193   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +106 **  
 +Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.   
 +**\\  
 +H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)533  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +107 **  
 +Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.   
 +**\\  
 +H.Wagner, C.Schiebl and W.S.M.Werner.  
 +\\ // 
 +Mikrochim. Act.,13(1996)623   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +108 **  
 +Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)13   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +109 **  
 +Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.   
 +**\\  
 +C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\"olz, W.S.M.Werner  and H.St\"ori.   
 +\\ // 
 +Vacuum 46(1995)1281  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +110 **  
 +Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.  
 +**\\  
 +W.S.M.Werner  
 +\\ // 
 +Surf. Interf. Anal., 23(1995)737   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +111 **  
 +Efficient Calculation of Photoelectron Angular Distribution.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin and A.Jablonski.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)823  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +112 **  
 +Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)696.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +113 **  
 +Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B52(1995)2964.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +114 **  
 +Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.  
 +**\\  
 +H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 22(1994)120   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +115 **  
 +Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra  of Polycrystalline Al, Ni, Pt and Au.  
 +**\\  
 +W.S.M.Werner and M.Hayek.  
 +\\ // 
 +Surf. Interf. Anal. 22(1994)79  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +116 **  
 +Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..   
 +**\\  
 +W.S.M.Werner, and I.S.Tilinin.   
 +\\ // 
 +J. Vac. Sci. Technol. A12(1994)2337.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +117 **  
 +Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.   
 +\\ // 
 +Surf. Interf. Anal. 21(1994)21  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +118 **  
 +Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.  
 +**\\  
 +W.S.M.Werner, M.Hayek and I.S.Tilinin.   
 +\\ // 
 +Phys. Rev. B50(1994)4819.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +119 **  
 +Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Prog. Surf. Sci. 46(1994)46.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +120 **  
 +New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act. 114/115(1994)485.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +121 **  
 +Reply to Comment on "Angular and Energy Distribution of Auger Electrons Emitted from  non-crystalline Targets" by V.M. Dwyer  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin .   
 +\\ // 
 +Surf. Sci. 304(1994)385.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +122 **  
 +The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\"ori and J.Barounig.   
 +\\ // 
 +Thin Solid Films 228(1993)56  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +123 **  
 +Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets  
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 290(1993)119.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +124 **  
 +Escape Probability of Auger and Photoelectrons from Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Appl. Surf. Sci. 70/71(1993)29.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +125 **  
 +Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\"ori and J.Barounig.   
 +\\ // 
 +Surface and Coatings Technology 54/55(1992)329   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +126 **  
 +Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent  XPS.  
 +**\\  
 +W.S.M.Werner, G.C.Smith and A.K.Livesey.  
 +\\ // 
 +Surf. Interf. Anal. 21(1992)38.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +127 **  
 +The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B46(1992)13739   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +128 **  
 +The Role of the Attenuation  Parameter in Electron Spectroscopy   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J. Electr.Spectrosc. Relat. Phen. 59(1992)275.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +129 **  
 +Attenuation of Electrons in Non-crystalline Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Surf. Sci. Lett. 268(1992)L319.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +130 **  
 +A new Formalism for  Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.   
 +**\\  
 +W.S.M.Werner and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal. 19(1992)83   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +131 **  
 +Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 18(1992)217.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +132 **  
 +Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.  
 +**\\  
 +W.S.M.Werner, W.H.Gries and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal.17(1991)693  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +133 **  
 +On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 257(1991)319   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +134 **  
 +Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 251/252(1991)336   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +135 **  
 +A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies   
 +**\\  
 +W.S.M.Werner, W.H.Gries and H. St\"ori   
 +\\ // 
 +J. Vac. Sci. Technol. A9(1991)21   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +136 **  
 +Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.  
 +**\\  
 +W.H.Gries and W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal. 16(1990)149   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +====List of lectures ==== 
 +1 **  
 +Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 22730−22738  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +2 **  
 +Correction to "Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2016, 120, 2484 84  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +3 **  
 +Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate  
 +**\\  
 +Wolfgang S.M. Werner  , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui   
 +\\ // 
 +Surface Science 635 (2015) L1–L3  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +4 **  
 +Physics-based Simulation Models for EBSD: Advances and Challenges  
 +**\\  
 +Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner  
 +\\ // 
 +arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +5 **  
 +Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra  
 +**\\  
 +M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell  
 +\\ // 
 +J. Phys. Chem. C 2015, 119, 17687  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +6 **  
 +Interpretation of nanoparticle X-ray photoelectron intensities  
 +**\\  
 +Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell  
 +\\ // 
 +Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +7 **  
 +In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al  
 +**\\  
 +Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek  
 +\\ // 
 +PHYSICAL REVIEW B 89, 205435 (2014)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +8 **  
 +Interlaboratory study comparing anylses of simulated angle resolved XP Spectra  
 +**\\  
 +Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal  and Cedric J. Powell  
 +\\ // 
 +Surf. Interf. Anal 46, (2014) 321   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +9 **  
 +Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing  
 +**\\  
 +D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. (2014)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +10 **  
 +SiON metrology using angular and energy distributions of photoelectrons  
 +**\\  
 +G Tasneem, C Tomastik, R Mroczynski and W S M Werner  
 +\\ // 
 +Journal of Physics: Conference Series 439 (2013) 012005  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +11 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials  
 +**\\  
 +Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +12 **  
 +Sample-morphology effects on x-ray photoelectron peak intensities  
 +**\\  
 +Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal  
 +\\ // 
 +021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +13 **  
 +Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface  
 +**\\  
 +Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani  
 +\\ // 
 +PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +14 **  
 +Electron Supersurface Scattering On Polycrystalline Au  
 +**\\  
 +Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +15 **  
 +Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm  
 +**\\  
 +F. Salvat-Pujol and W. S. M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +16 **  
 +Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)  
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +17 **  
 +In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface  
 +**\\  
 +J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner  
 +\\ // 
 +Surf. Interface Anal. (2013) DOI 10.1002/sia.5331  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +18 **  
 +Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric  
 +**\\  
 +O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli  
 +\\ // 
 +Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +19 **  
 +Angular dependence of electron induced surface plasmon excitation                                                                   
 +**\\  
 +Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner  
 +\\ // 
 +APL 98(2011)193111  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +20 **  
 +Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy  
 +**\\  
 +F. Salvat-Pujol* and W. S. M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +21 **  
 +Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations  
 +**\\  
 +G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. (2010)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +22 **  
 +Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data  
 +**\\  
 +G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell  
 +\\ // 
 +Surf. Interf. Anal. 42(2010)1072  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +23 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +W.S.M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B82(2010)155422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +24 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +W.S.M. Werner   
 +\\ // 
 +J. Elec. Spec. Rel. Phen. 178-179(2010)154-177  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +25 **  
 +Reflection electron energy loss spectroscopy of aluminum   
 +**\\  
 +P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 1006-1009  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +26 **  
 +Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 604 (2010) 290-299  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +27 **  
 +Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek  
 +\\ // 
 +PHYSICAL REVIEW B 82, 155422  2010 DOI: 10.1103/PhysRevB.82.155422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +28 **  
 +Electron transport for spectrum analysis and experiment design  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +29 **  
 +Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)  
 +**\\  
 +Wolfgang S.M. Werner   
 +\\ // 
 +Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +30 **  
 +Optical constants and inelastic electron-scattering data for 17 elemental metals  
 +**\\  
 +Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +31 **  
 +Richardson - Lucy deconvolution of reflection electron energy loss spectra   
 +**\\  
 +Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. (2009)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +32 **  
 +Report on the 47th IUVSTA Workshop "Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films"  
 +**\\  
 +A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\"over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme  
 +\\ // 
 +Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +33 **  
 +Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals  
 +**\\  
 +Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl  
 +\\ // 
 +J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009  doi:10.1063/1.3243762   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +34 **  
 +Role of surface and bulk plasmon decay in secondary electron emission   
 +**\\  
 +Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani  
 +\\ // 
 +Phys. Rev. B 78 (2008)233403  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +35 **  
 +Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra   
 +**\\  
 +M.R. Went  M. Vos a, W.S.M. Werner   
 +\\ // 
 +Surf. Sci. 602(2008)2069-2077  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +36 **  
 +Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths  
 +**\\  
 +Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl  
 +\\ // 
 +Phys. Rev. B 77, R161404 (2008)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +37 **  
 +Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 601 (2007) 2125-2138  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +38 **  
 +Photon and electron induced electron emission from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Cahpter 2 In "Slow Heavy Particle Induced Electron Emission from Solid Surfaces", Springer Tracts in Modern Physics 225  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +39 **  
 +Energy dependence of electron energy loss processesin Ge 2s photoemission  
 +**\\  
 +M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 601(2007)2344  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +40 **  
 +Comparison of hard and soft x-ray photoelectron spectra of silicon  
 +**\\  
 +F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione  
 +\\ // 
 +Phys. Rev. B76(2007)085422  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +41 **  
 +Surface plasmon excitation at a Au surface by 15040,000 eV electrons  
 +**\\  
 +Wolfgang S.M. Werner, Michael R. Went, Maarten Vos  
 +\\ // 
 +Surf. Sci.  601(2007)L109  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +42 **  
 +Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy  
 +**\\  
 +C. J. Powell, W. S. M. Werner, and W. Smekal  
 +\\ // 
 +Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +43 **  
 +Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria  
 +**\\  
 +Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\"udenauer and John F. Watts  
 +\\ // 
 +Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +44 **  
 +Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 252116  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +45 **  
 +Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 213106  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +46 **  
 +Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, W.S.M. Werner and W. Smekal  
 +\\ // 
 +APPLIED PHYSICS LETTERS 89, 172101  (2006)   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +47 **  
 +Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 600(2006)L250-254  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +48 **  
 +Differential surface and volume excitation probability of medium-energy electrons in solids.  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Phys. Rev. B 74(2006) 075421   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +49 **  
 +Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations  
 +**\\  
 +J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski  
 +\\ // 
 +Surf. Interf. Anal.38(2006)615  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +50 **  
 +Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O  
 +**\\  
 +W. S. M. Werner, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)628  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +51 **  
 +Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge  
 +**\\  
 +L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 38(2006)569  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +52 **  
 +EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY  
 +**\\  
 +W.S.M. Werner, W. Smekal, H. St\"ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini  
 +\\ // 
 +Elletra research highlights 2004-2005  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +53 **  
 +Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR  
 +**\\  
 +Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\"ori H  
 +\\ // 
 +Life Cycle Tribology 48(2005)  269-282  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +54 **  
 +Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy  
 +**\\  
 +C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal  
 +\\ // 
 +Applied Surface Science 239 (2005) 470-480  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +55 **  
 +On the energy dissipation process in incoherent electron scattering  
 +**\\  
 +Wolfgang S.M. Werner, Peter Schattschneider  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +56 **  
 +Oxidation of beryllium: a scanningAuger investigation  
 +**\\  
 +C. Tomastik,W. Werner and H. St\"ori  
 +\\ // 
 +Nucl. Fusion 45 (2005) 1061-1065  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +57 **  
 +Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy  
 +**\\  
 +Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini  
 +\\ // 
 +Phys. Rev. Lett. 94 (2005) 038302  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +58 **  
 +A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon  
 +**\\  
 +C.J. Powell, W. Smekal and W.S.M. Werner  
 +\\ // 
 +Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +59 **  
 +Angular-resolved photoelectron spectroscopyof corrugated surfaces  
 +**\\  
 +K. Olejnik, J. Zemek and W.S.M. Werner  
 +\\ // 
 +Surface Science 595 (2005) 212-222  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +60 **  
 +Coherence in electron energy loss spectrometry  
 +**\\  
 +P. Schattschneider and W.S.M. Werner  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +61 **  
 +Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy  
 +**\\  
 +Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 1059-1067  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +62 **  
 +Trajectory reversal approach for electron backscattering from solid surfaces  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +PHYSICAL REVIEW B 71, 115415 (2005)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +63 **  
 +Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interface Anal. 2005; 37: 846-860  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +64 **  
 +Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces  
 +**\\  
 +Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga  
 +\\ // 
 +Surface Science 585 (2005) 85-94  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +65 **  
 +Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surface Science 588 (2005) 26-40  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +66 **  
 +Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy  
 +**\\  
 +G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\"ori D.L. Beke  
 +\\ // 
 +Thin Solid Films 459 (2004) 303-307  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +67 **  
 +Quantitative surface analysis with electrons  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Applied Surface Science 235 (2004) 2-14  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +68 **  
 +Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models  
 +**\\  
 +W. Smekal, W.S.M. Werner, C.S. Fadley and  M.A. van Hove  
 +\\ // 
 +Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +69 **  
 +Electron Transport in Solids Chapter 10 in the book "Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy"  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +70 **  
 +Charakterisierung monomolekuarer Schmierstofffilme  
 +**\\  
 +R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\"ori  
 +\\ // 
 +in "Zuverl‰ssige Tribosysteme", Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +71 **  
 +Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.  
 +**\\  
 +W.S.M. Werner, C Eisenmenger--Sittner, J. Zemek and P. Jiricek  
 +\\ // 
 +Phys. Rev. B. 67(2003)  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +72 **  
 +Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Interf. Anal. 35(2003)347  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +73 **  
 +Surface and bulk plasmon coupling observed in refelection electron energy loss spectra  
 +**\\  
 +W.S.M. Werner  
 +\\ // 
 +Surf. Sci. 526(2003)L159-L164  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +74 **  
 +Wannier-Stark States in Finite Superlattices  
 +**\\  
 +M. Kast, C. Pacher, G. Strasser, E. Gornikand  W.S.M. Werner  
 +\\ // 
 +Phys. Rev. Lett. 89(2002)136803  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +75 **  
 +Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni  
 +**\\  
 +L. Kñver, S. Tougaard,  W.S.M. Werner,  and I. Cserny  
 +\\ // 
 +Surf. Interf. Anal. 33(2002)681  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +76 **  
 +Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)  
 +**\\  
 +W.S.M. Werner,  H. St\"ori and HP. Winter  
 +\\ // 
 +Surf. Sci. 518(2002)L569  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +77 **  
 +Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of  Thin Cu and Ni Films   
 +**\\  
 +W.S.M. Werner,  L. Kñver, J. Toth and D. Varga  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  122(2002)103  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +78 **  
 +Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces  
 +**\\  
 +Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner  
 +\\ // 
 +J. Vac. Sci. Technol. A 19, Sep-Oct 2001  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +79 **  
 +Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons  Backscattered from Al and Si Surfaces.   
 +**\\  
 +W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Vac. Sci. Technol.  A19(2001)2388  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +80 **  
 +The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of  Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.   
 +**\\  
 +W.S.M.Werner, H. Tratnik, J. Brenner  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  495(2001)107  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +81 **  
 +Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces  
 +**\\  
 +W.S.M. Werner,  W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\"ori  
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  114(2001)363  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +82 **  
 +Surface Excitation Probability  of Medium .Energy Electrons in Metals and  Semiconductors.   
 +**\\  
 +W.S.M.Werner, W. Smekal, C. Tomastik  and H. St\"ori   
 +\\ // 
 +Surf. Sci.  486(2001)L461  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +83 **  
 +Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)141  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +84 **  
 +Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons  Backscattered from a Polycrystalline Au Surface  
 +**\\  
 +W.S.M.Werner, W. Smekal  and H. St\"ori   
 +\\ // 
 +Surf. Interf. Analysis 31(2001)475  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +85 **  
 +Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental  Solids for Energies between 50 and 3400~eV.  
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +J. Electron, Spectrosc. Rel. Phen.  113(2001)127  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +86 **  
 +Electron Probe Microanalysis Inverse Modelling   
 +**\\  
 +H.W. Wagner, W.S.M.Werner, H. St\"ori and L. Richardson  
 +\\ // 
 +Nucl. Instr. Methods. Phys. Res.  B184(2001)450  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +87 **  
 +On Line Shape Analysis in X-ray Photoelectron spectroscopy   
 +**\\  
 +W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek  
 +\\ // 
 +Surf. Sci.  470(2001)325  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +88 **  
 +Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.     
 +**\\  
 +W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\"ori   
 +\\ // 
 +Surf. Sci.  470(2000)L123  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +89 **  
 +Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples   
 +**\\  
 +K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver  
 +\\ // 
 +Surf. Interf. Analysis 29(2000)126  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +90 **  
 +Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)386  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +91 **  
 +Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory   
 +**\\  
 +H. Ebel, R. Svagera, M.F. Ebel  and W.S.M. Werner   
 +\\ // 
 +Adv. X-ray Anal. 44(2000)380  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +92 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments  .   
 +**\\  
 +H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel   
 +\\ // 
 +Adv. X-ray Anal. 41(1999)367  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +93 **  
 +Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.   
 +**\\  
 +S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton  and B. Fricke   
 +\\ // 
 +Surf. Sci.  417(1998)372  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +94 **  
 +Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach  
 +**\\  
 +H. W. Wagner and W. S. M. Werner  
 +\\ // 
 +X-RAY SPECTROMETRY,27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +95 **  
 +Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.   
 +**\\  
 +P.M.J.Schm\"olz, W.S.M.Werner, H. Wagner, H.St\"ori and J. Kiefer.  
 +\\ // 
 +Surf. Interf. Anal, 26(1998)590   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +96 **  
 +Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.  
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal, 26(1998)455  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +97 **  
 +A New Method for the Calculation of Ionization Depth Distribution in EPMA  
 +**\\  
 +H. Wagner and W.S.M.Werner   
 +\\ // 
 +X-Ray Spectrometry, 27(1998)373  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +98 **  
 +Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.   
 +**\\  
 +W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte,  V. Ambrose and J. Baker   
 +\\ // 
 +J. Vac. Sci. and Technol., B16(1998)420   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +99 **  
 +Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J.Vac. Sci. Technol, A15(1997)465  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +100 **  
 +Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Jap. J. of Surface Anal., 3(1997)312  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +101 **  
 +Slowing Down of Medium Energy Electrons in Solids.   
 +**\\  
 +W.S.M.Werner   
 +\\ // 
 +Phys. Rev., B55(1997)14925   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +102 **  
 +Escape Probability of Electrons in Total Electron Yield Experiments   
 +**\\  
 +H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel  
 +\\ // 
 +Adv. x-Ray Analysis, in print   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +103 **  
 +Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy  
 +**\\  
 +I.S. Tilinin, A. Jablonski and W.S.M. Werner  
 +\\ // 
 +Progress in Surface Science 52(1996)193-335  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +104 **  
 +A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.   
 +**\\  
 +H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner,  H.St\"ori and M. Gr\"oschl  
 +\\ // 
 +Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +105 **  
 +Quantitative Surface Analysis by Means of AES.   
 +**\\  
 +I.S.Tilinin, A.Jablonski and W.S.M.Werner.   
 +\\ // 
 +Prog. Surf. Sci., 52(1996)193   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +106 **  
 +Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.   
 +**\\  
 +H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)533  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +107 **  
 +Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.   
 +**\\  
 +H.Wagner, C.Schiebl and W.S.M.Werner.  
 +\\ // 
 +Mikrochim. Act.,13(1996)623   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +108 **  
 +Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act., 13(1996)13   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +109 **  
 +Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.   
 +**\\  
 +C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\"olz, W.S.M.Werner  and H.St\"ori.   
 +\\ // 
 +Vacuum 46(1995)1281  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +110 **  
 +Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.  
 +**\\  
 +W.S.M.Werner  
 +\\ // 
 +Surf. Interf. Anal., 23(1995)737   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +111 **  
 +Efficient Calculation of Photoelectron Angular Distribution.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin and A.Jablonski.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)823  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +112 **  
 +Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal., 23(1995)696.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +113 **  
 +Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B52(1995)2964.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +114 **  
 +Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.  
 +**\\  
 +H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 22(1994)120   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +115 **  
 +Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra  of Polycrystalline Al, Ni, Pt and Au.  
 +**\\  
 +W.S.M.Werner and M.Hayek.  
 +\\ // 
 +Surf. Interf. Anal. 22(1994)79  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +116 **  
 +Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..   
 +**\\  
 +W.S.M.Werner, and I.S.Tilinin.   
 +\\ // 
 +J. Vac. Sci. Technol. A12(1994)2337.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +117 **  
 +Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.   
 +**\\  
 +W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.   
 +\\ // 
 +Surf. Interf. Anal. 21(1994)21  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +118 **  
 +Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.  
 +**\\  
 +W.S.M.Werner, M.Hayek and I.S.Tilinin.   
 +\\ // 
 +Phys. Rev. B50(1994)4819.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +119 **  
 +Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Prog. Surf. Sci. 46(1994)46.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +120 **  
 +New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Mikrochim. Act. 114/115(1994)485.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +121 **  
 +Reply to Comment on "Angular and Energy Distribution of Auger Electrons Emitted from  non-crystalline Targets" by V.M. Dwyer  
 +**\\  
 +W.S.M.Werner and I.S.Tilinin .   
 +\\ // 
 +Surf. Sci. 304(1994)385.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +122 **  
 +The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\"ori and J.Barounig.   
 +\\ // 
 +Thin Solid Films 228(1993)56  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +123 **  
 +Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets  
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 290(1993)119.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +124 **  
 +Escape Probability of Auger and Photoelectrons from Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Appl. Surf. Sci. 70/71(1993)29.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +125 **  
 +Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12  
 +**\\  
 +P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\"ori and J.Barounig.   
 +\\ // 
 +Surface and Coatings Technology 54/55(1992)329   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +126 **  
 +Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent  XPS.  
 +**\\  
 +W.S.M.Werner, G.C.Smith and A.K.Livesey.  
 +\\ // 
 +Surf. Interf. Anal. 21(1992)38.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +127 **  
 +The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.   
 +**\\  
 +I.S.Tilinin and W.S.M.Werner.   
 +\\ // 
 +Phys. Rev. B46(1992)13739   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +128 **  
 +The Role of the Attenuation  Parameter in Electron Spectroscopy   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +J. Electr.Spectrosc. Relat. Phen. 59(1992)275.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +129 **  
 +Attenuation of Electrons in Non-crystalline Solids.   
 +**\\  
 +W.S.M.Werner and I.S.Tilinin.   
 +\\ // 
 +Surf. Sci. Lett. 268(1992)L319.  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +130 **  
 +A new Formalism for  Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.   
 +**\\  
 +W.S.M.Werner and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal. 19(1992)83   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +131 **  
 +Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.  
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Interf. Anal. 18(1992)217.   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +132 **  
 +Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.  
 +**\\  
 +W.S.M.Werner, W.H.Gries and H.St\"ori.   
 +\\ // 
 +Surf. Interf. Anal.17(1991)693  
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +133 **  
 +On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 257(1991)319   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +134 **  
 +Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.   
 +**\\  
 +W.S.M.Werner.   
 +\\ // 
 +Surf. Sci. 251/252(1991)336   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +135 **  
 +A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies   
 +**\\  
 +W.S.M.Werner, W.H.Gries and H. St\"ori   
 +\\ // 
 +J. Vac. Sci. Technol. A9(1991)21   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
 +136 **  
 +Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.  
 +**\\  
 +W.H.Gries and W.S.M.Werner   
 +\\ // 
 +Surf. Interf. Anal. 16(1990)149   
 +\\   
 +  
 +  
 +\\  
 +  
 +  
spt/research/xy.txt · Last modified: 2017-01-12 15:37 by Wolfgang Werner