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spt:group:werner:list_of_lectures [2017-01-12 15:45] (current)
Wolfgang Werner created
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 +=====List of lectures =====
 +1 **
 +Structuring Simulation Software for SIMDALEE2 
 +**\\
 +Wolfgang S.M. Werner 
 +\\ //
 +Lecture at the Simdalee2 cluster meeting, Nov. 22. 2014., Brno, Czech Republic, 
 +\\ 
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 +2 **
 +Dielectric properties, correlation and screening in graphitic substances
 +**\\
 +Wolfgang Werner
 +\\ //
 +ECOSS 30, Sept 5, 2014 Antalya (Tr)
 +\\ 
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 +3 **
 +Secondary Electron Electron Energy Loss Coincidence Spectroscopy (SE2ELCS) ofAluminum and various Carbon Allotropes 
 +**\\
 +Alessandra Bellissimo,  Wolfgang Werner
 +\\ //
 +Poster at the International Workshop on Photoemission and Resonant Inelastic X-ray Scattering (IWPRIXS) Sept. 1st, 2014 Erice, (I)
 +\\ 
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 +4 **
 +sp2-content of carbon allotropes: a comparative study using Raman- and Electron Spectroscopy
 +**\\
 +Alessandra Bellissimo, Wolfgang Werner, Maksymilian Chudzicki, Afshan Tasneem, Johannes Ofner and Bernhard Lendl 
 +\\ //
 +Poster at the yearly Raman spectroscopy workshop, TU Viena, april 25. 2014
 +\\ 
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 +5 **
 +Interpretation of Nanoparticle X-ray photoelectron intensities
 +**\\
 +Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, Annette Foelske-Schmitz and Cedric J. Powell
 +\\ //
 +Lecture at the 16th European Conference on Applications of Surface and Interface Analysis (ECASIA’15)Granada, Spain. September 28th - October 1st, 2015
 +\\ 
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 +6 **
 +Secondary Electron Electron Energy Loss Coincidence Spectroscopy (SE2ELCS) of Aluminum and various Carbon Allotropes 
 +**\\
 +Alessandra Bellissimo,  Wolfgang Werner
 +\\ //
 +Poster at the IWPRIXS Sept. 2014 Erice, Sicily
 +\\ 
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 +7 **
 +Secondary Electron Energy Loss Coincidence Spectroscopy
 +**\\
 +W.S.M. Werner
 +\\ //
 +Seminar Lecture at the Solid State Physics Group, ETH Z|rich, January 14 2010
 +\\ 
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 +8 **
 +Report on the 47th IUVSTA Workshop `Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films
 +**\\
 +A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado,C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi,L. Kover, H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace,W. S. M. Werner and J. Wolstenholme
 +\\ //
 +Surf.Interface Anal. 41(2009)840-857
 +\\ 
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 +9 **
 +Tribological properties of additives for water-based lubricants 
 +**\\
 +A. Tomala, A. Karpinska, Krystallia Psychogyiopoulou, W.S.M. Werner, A. Olver, H. St\"ori 
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +10 **
 +Round Robin Study On Data-Processing Algorithms for Angle-Resolved X-Ray Photoelectron Spectroscopy. (VAMAS Surface Analysis Project A11)
 +**\\
 +G. Tasneem, W. Werner, W. Smekal, C.J. Powell
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +11 **
 +REELS of the aluminum 
 +**\\
 +P. Jiricek, I. Bartos, J. Zemek and W.S.M. Werner 
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +12 **
 +Round Robin Study On Data-Processing Algorithms for Angle-Resolved X-Ray Photoelectron Spectroscopy. (VAMAS Surface Analysis Project A11)
 +**\\
 +G. Tasneem, W. Werner, W. Smekal, C.J. Powell
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +13 **
 +Effects of Elastic Scattering and Analyzer-Acceptance Angle on the Analysis of Angle-Resolved XPS Data
 +**\\
 +C.J. Powell, W.S.M. Werner, and W. Smekal
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +14 **
 +Measurements and ab-initio calculations of the electron inelastic mean free path (IMFP) of 20 materials
 +**\\
 +W.S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +15 **
 +Photoelectron Angular Distributions of 5 Elemental Solids
 +**\\
 +C. Tomastik, J. Brenner, G. Tasneem, S. Gerhold, W. Smekal, W.S.M. Werner, and C.J. Powell
 +\\ //
 +Lecture at the 13th European Conference on Applications of Surface and Interface Analysis (ECASIA09), Antalya, Turkey, October 18-23, 2009
 +\\ 
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 +16 **
 +Highlights of the field of  electron spectroscopy in the group surface and plasma technology
 +**\\
 +W.S.M. Werner
 +\\ //
 +Vortrag am IAP seminar am 17.01.2007
 +\\ 
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 +17 **
 +Optical constants of solids measured with Reflection Electron Energy Loss spectroscopy (REELS)
 +**\\
 +W. S. M. Werner
 +\\ //
 +Lecture at the European Conference on Applications of Surface and Interface Analysis ECASIA07, september 2-25, 2007, Brussels
 +\\ 
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 +18 **
 +Is Surface Roughness Important in Elastic Peak Electron Spectroscopy?
 +**\\
 +K. Olejnik, J. Zemek and W. S. M. Werner
 +\\ //
 +11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic
 +\\ 
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 +19 **
 +Correlated Ion Induced Electron Emission from Solid Surfaces
 +**\\
 +W Smekal, W S M Werner, H St\"ori and HP Winter
 +\\ //
 +11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic
 +\\ 
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 +20 **
 +Optical Constants of Solids Measured with Reflection Electron Energy Loss Spectroscopy (REELS)
 +**\\
 +W. S. M. Werner
 +\\ //
 +11th Joint Vacuum Conference, September 24-28, Prague, Czech Republic
 +\\ 
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 +21 **
 +Electron Transport Processes  for Surface Analysis
 +**\\
 +W. S. M. Werner
 +\\ //
 +Tutorial Lecture, Workshop "Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B) 
 +\\ 
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 +22 **
 +NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W. S. M. Werner, W. Smekal and C. J. Powell
 +\\ //
 +Lecture, Workshop "Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B) 
 +\\ 
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 +23 **
 +Partial Intensity Analysis for Quantitative Interpretation of Surface Electron Spectra.
 +**\\
 +W. S. M. Werner
 +\\ //
 +Invited Lecture, Workshop "Modeling and Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques, Brussels, September 13-15, 2006 (B) 
 +\\ 
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 +24 **
 +NIST databases with parameters describing electron transport in solids
 +**\\
 +C. J. Powell, A. Jablonski, W. S. M. Werner, and W. Smekal
 +\\ //
 +lecture at th the 8th International School and Symposium on Synchrotron Radiation in Natural Science, 12-17 June 2006, Zakopane (Poland)
 +\\ 
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 +25 **
 +Surface Excitations for Electron Spectroscopy
 +**\\
 +W.S.M Werner
 +\\ //
 +Seminar Lecture presented at the Instituto Balseiro and Centro Atomico in Bariloche (Argentina) on 22.02.2006
 +\\ 
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 +26 **
 +Electron beam techniques for surface analysis
 +**\\
 +W.S.M Werner
 +\\ //
 +Class presented at the Instituto Balseiro and Centro Atomico in Bariloche (Argentina) on 21.2.2006, 22.02.2006 and 23.02.2006
 +\\ 
 +
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 +27 **
 +Film thickness determination of ultra thin HfO2 dielectrics with angle resolved XPS: Experimental electron scattering data
 +**\\
 +W.S.M. Werner, C. Tomastik, W. Smekal, D.W. Moon. K.J. Kim and C.J. Powell
 +\\ //
 +Americam Vacuum Symposium 2006, San Francisco (US), 15 Nov 2006
 +\\ 
 +
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 +28 **
 +Surface Sensitivity of Electron Spectroscopy Techniques- Status-Quo and Perspectives 
 +**\\
 +W.S.M. Werner
 +\\ //
 +Seminar lecture held at Universita di Roma Tre, 14 Nov 2006
 +\\ 
 +
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 +29 **
 +Emission depth selectivity with Auger-Photoelectron coincidence spectroscopy
 +**\\
 +G. Stefani,  A. Ruocco, F. Offi, R. Gotter, A. Morgante and F. TommasiniW.S.M Werner, W. Smekal, H. St\"ori, HP. Winter 
 +\\ //
 +Matter Materials and Devices Meeting, Genova/I, 23.6.2005
 +\\ 
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 +30 **
 +Measurement of Thicknesses of HfO2, HfSiO4, ZrO2, and ZrSiO4 Films on Silicon by Angle-Resolved XPS
 +**\\
 +W. Smekal W. S. M. Werner and C. J. Powell
 +\\ //
 +AVS Symposium Boston, October 30-November 4, October 31
 +\\ 
 +
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 +31 **
 +A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 films on silicon
 +**\\
 +Cedric J. Powell, Werner Smekal and Wolfgang S.M. Werner
 +\\ //
 +Characterization and Metrology for ULSI Technology 2005, Richardson Texas, 15-18 March 2005, 16 March
 +\\ 
 +
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 +
 +32 **
 +Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +Wolfgang S.M. Werner, Werner Smekal and Cedric J. Powell
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
 +
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 +33 **
 +Non destructive depth-profiling with Auger-photoelectron coincidence spectroscopy
 +**\\
 +W. S. M. Werner, W. Smekal, H. St\"ori, H. Winter, G. Stefani, A. Ruocco, F. Offi, R. Gotter, A. Morgante and F. Tommasini
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
 +
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 +34 **
 +Intrinsic and extrinsic losses in deep core photoelectron and Auger spectra of solid Ge and Si
 +**\\
 +L. Kˆver, M. Novak, S. Egri, I. Cserny, Z. Berenyi, J. Toth, J. VÈgh, D. Varga, W. Drube, F. Yubero, S. Tougaard, W. S. M. Werner
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
 +
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 +35 **
 +Measurement of Thicknesses of HfO2, HfSiO4, ZrO2, and ZrSiO4 Films on Silicon by Angle-Resolved XPS
 +**\\
 +W. Smekal, W. S. M. Werner, and C. J. Powell
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
 +
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 +36 **
 +Differential surface and volume excitation probability and photoelectron source functions of Cu, CuO and Cu2O
 +**\\
 +Wolfgang S.M. Werner, Josef Zemek, and Petr Jiricek
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
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 +37 **
 +Angular-resolved elastic peak electron spectroscopy. Experiment, analytical and Monte Carlo calculations.
 +**\\
 +Zemek J., Jiricek P., Werner W.S.M., Lesiak B., and Jablonski A.
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
 +
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 +38 **
 +Influence of surface roughness on elastic peak electron spectra
 +**\\
 +Olejnik K., Werner W.S.M., and Zemek J.
 +\\ //
 +Lecture at the 11th European Conference on Surface and Interface Analysis, ECASIA'05, Vienna/A, Sept. 25-29, 2005
 +\\ 
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 +39 **
 +Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +Practical Surface Analysis 04 (PSA-04), Jeju/Korea, 6.10.2004 (Poster)
 +\\ 
 +
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 +40 **
 +Trajectory Reversal Approach to Quasi-Elastic Electron Backscattering from Solid Surfaces
 +**\\
 +W.S.M. Werner
 +\\ //
 +Practical Surface Analysis 04 (PSA-04), Jeju/Korea, 6.10.2004 (Poster)
 +\\ 
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 +41 **
 +Modeling of Electron Transport in AES and XPS
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +Workshop on Electron Scattering in Solids: From Fundamental Concepts to PracticalApplications (IUVSTA), Debrecen/H, 7.7.2004
 +\\ 
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 +42 **
 +Simulation of electron spectra for surface analysis I: physical data and physical model
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +Workshop on Electron Scattering in Solids: From Fundamental Concepts to PracticalApplications (IUVSTA), Debrecen/H, 5.7.2004
 +\\ 
 +
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 +43 **
 +Simulation of electron spectra for surface analysis
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +17th Symp. on Surface Science (3S '04), St. Christoph am Arlberg/Tirol, 29.2. - 6.3.2004(Poster)
 +\\ 
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 +44 **
 +Surface and bulk plasmon coupling observed in reflection electron energy loss spectra
 +**\\
 +W.S.M. Werner
 +\\ //
 +17th Symp. on Surface Science (3S '04), St. Christoph am Arlberg/Tirol, 29.2. - 6.3.2004(Poster)
 +\\ 
 +
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 +45 **
 +Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 10.10.2003
 +\\ 
 +
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 +46 **
 +Obtaining Quantitative Information on Surface Excitations from Reflection Electron Energy LossSpectra (REELS)
 +**\\
 +W.S.M. Werner
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 9.10.2003
 +\\ 
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 +47 **
 +Software Demonstration: Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003
 +\\ 
 +
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 +48 **
 +Simulation of electron spectra for surface analysis
 +**\\
 +W.S.M. Werner (gem. mit. W. Smekal und C.J. Powell)
 +\\ //
 +Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003 (Poster)
 +\\ 
 +
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 +49 **
 +Scattering angle dependence of the surface excitation probability in reflection electron energy lossspectra
 +**\\
 +W.S.M. Werner (gem. mit C. Eisenmenger-Sittner, J. Zemek und P. Jiricek)
 +\\ //
 +Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003(Poster)
 +\\ 
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 +50 **
 +Wechselwirkung schneller Elektronen mit Festkˆrperoberfl‰chen
 +**\\
 +W.S.M. Werner
 +\\ //
 +Firma Ion Micro Systems (IMS), Wien, 18.2 2003
 +\\ 
 +
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 +51 **
 +Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 10.10.2003
 +\\ 
 +
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 +52 **
 +Obtaining Quantitative Information on Surface Excitations from Reflection Electron Energy LossSpectra (REELS)
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 9.10.2003
 +\\ 
 +
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 +53 **
 +Software Demonstration: Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003
 +\\ 
 +
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 +54 **
 +Simulation of electron spectra for surface analysisInt. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003 
 +**\\
 +W.S.M. Werner (gem. mit. W. Smekal und C.J. Powell)
 +\\ //
 +Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003 
 +\\ 
 +
 +
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 +55 **
 +Scattering angle dependence of the surface excitation probability in reflection electron energy lossspectra
 +**\\
 +W.S.M. Werner (gem. mit C. Eisenmenger-Sittner, J. Zemek und P. Jiricek)
 +\\ //
 +Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003
 +\\ 
 +
 +
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 +56 **
 +Wechselwirkung schneller Elektronen mit Festkˆrperoberfl‰chen
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Firma Ion Micro Systems (IMS), Wien, 18.2 2003
 +\\ 
 +
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 +57 **
 +Charakterisierung von monomolekularen Schmierstofffilmen
 +**\\
 +H. St\"ori (gem. mit R. Kolm, L. Vokovic und W.S.M. Werner)
 +\\ //
 +Zuverl‰ssige Tribosysteme, Jahrestagung der ÷sterr. Tribologischen Gesellschaft, Schwechat,20.11.2003
 +\\ 
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 +58 **
 +Influence of coherent scattering (diffraction) on the Depth Distribution Function (DDF) in XPS/AESon polycrystalline surfaces
 +**\\
 +W. Smekal (gem. mit W.S.M. Werner, C.S. Fadley und M.A. van Hove)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003
 +\\ 
 +
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 +59 **
 +Surface sensitivity in electron spectroscopy: coherent vs incoherent scattering models
 +**\\
 +W. Smekal (gem. mit W.S.M. Werner, C.S. Fadley und M.A. van Hove)
 +\\ //
 +Int. Conf. on Electron Spectroscopy and Structure (ICESS-9), Uppsala/S, 30.6.2003
 +\\ 
 +
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 +60 **
 +Measurement of the C 1s electron mean free path in octadecylsiloxane thin films on siliconby means of angle resolved XPS
 +**\\
 +R. Kolm (gem. mit J. Foisner, G. Friedbacher, R. Kleiner, W.S.M. Werner und H. St\"ori)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 6.10.2003
 +\\ 
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 +61 **
 +In situ XPS measurements of electrochemically prepared thin films
 +**\\
 +C. Jogl (gem. mit W.S.M. Werner und H. St\"ori)
 +\\ //
 +10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03), Berlin/D, 8.10.2003
 +\\ 
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 +62 **
 +ESCA study of ultrathin lubricant layers
 +**\\
 +I.C. Gebeshuber (gem. mit R. Kolm, R. Kleiner, A. Ecker, W.S.M. Werner und H. St\"ori)
 +\\ //
 +Tribology in Microsystems (TRIMIS 2003), Neuchatel/CH, 2.6.2003 
 +\\ 
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 +63 **
 +C. Forsich, J. Laimer (gem. mit A. Bonanni, K. Hingerl, D. Stifter, J. Brenner, W.S.M. Wernerund H. St\"ori)In-situ spectroscopic ellipsometry as sensor for hard coating and steel nitriding
 +**\\
 +C. Forsich, J. Laimer (gem. mit A. Bonanni, K. Hingerl, D. Stifter, J. Brenner, W.S.M. Wernerund H. St\"ori)
 +\\ //
 +3rd Int. Conf. on Spectroscopic Ellipsometry (ICSE-3), Wien, 8.7.2003 
 +\\ 
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 +\\
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 +64 **
 +Quantitative surface analysis: influence of electron transport
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Quantitative surface analysis: influence of electron transportSeminarvortrag, Instituto de Ciencia de Materiales de Sevilla, Sevilla/S, 14.11.2002
 +\\ 
 +
 +
 +\\
 +
 +
 +65 **
 +Partial Intensity Analysis: a universal method for elimination of multiple scattering fromelectron spectra
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Workshop: XPS- from data to results, St. Malo/F, 23.4.2002 
 +\\ 
 +
 +
 +\\
 +
 +
 +66 **
 +Simulation of Electron Spectra for Surface Analysis (SESSA)
 +**\\
 +W.S.M. Werner (gem. mit W. Smekal und C.J. Powell)
 +\\ //
 +Workshop: XPS- from data to results, St. Malo/F, 23.4.2002 
 +\\ 
 +
 +
 +\\
 +
 +
 +67 **
 +The role of surface excitations in quantitative electron spectroscopy
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Symp. on Surface Science 2002 (3S'02), St. Christoph am Arlberg/Tirol, 6.3.2002
 +\\ 
 +
 +
 +\\
 +
 +
 +68 **
 +Elektronenspektroskopie tribologischer Oberfl‰chen
 +**\\
 +H. St\"ori und W.S.M. Werner
 +\\ //
 +Tagung der ˆsterr. Tribologischen Gesellschaft, Wiener Neustadt/N÷, 28.11.2002
 +\\ 
 +
 +
 +\\
 +
 +
 +69 **
 +Quantitative Analysis of surface electron spectra
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 27.11.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +70 **
 +Electron transport in solids for quantitative surface analysis
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 22.11.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +71 **
 +Principles of electron spectroscopy on solid surfaces
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Abteilung f¸r Plasmaphysik, Komenius Universit‰t Bratislava/SK, 15.11.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +72 **
 +Surface excitations in quantitative electron spectroscopy
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +American Vacuum Symp. (AVS), San Fransisco, California/USA, 29.10.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +73 **
 +DBQUEST: a Database for Quantitative Electron Spectroscopy
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, US National Institute for Standards and Technology (NIST), Gaithersburg,Maryland/USA, 23.10.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +74 **
 +Surface excitations in Auger electron spectroscopy
 +**\\
 +W.S.M. Werner (gem. mit J. Brenner, H. Tratnik und H. St\"ori)
 +\\ //
 +9th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA), Avignon/F, 1.10.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +75 **
 +Quantitative Elektronenspektroskopie nicht-kristalliner Festk\"orperoberfl\"achen
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Universit‰t Freiburg/D, 19.1.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +76 **
 +Quantitative Elektronenspektroskopie an Festkˆrperoberfl‰chen
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Institut f¸r Festkˆrper- und Werkstoffanalytik (IFW), Dresden/D, 5.7.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +77 **
 +Progress and Problems in Quantitative Electron Spectroscopy
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Institut f¸r Theoretische Physik, TU Wien, 28.6.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +78 **
 +Inelastische mittlere freie Wegl‰nge von Elektronen im mittleren Energiebereich in Ti, TiC,TiN, TiO2 and TiSi2
 +**\\
 +C. Tomastik (gem. mit J. Brenner, W.S.M. Werner und H. St\"ori)
 +\\ //
 +51. Jahrestagung der ÷sterr. Physikalische Gesellschaft (÷PG), TU Wien, 17. - 21.9.2001
 +\\ 
 +
 +
 +\\
 +
 +
 +79 **
 +Electron Inelastic Mean Free Path (IMFP) for Medium Energy Electrons in Ti, TiC, TiN, TiO2and TiSi2
 +**\\
 +H. St\"ori (gem mit C. Tomastik, J. Brenner und W.S.M. Werner)
 +\\ //
 +15th Int. Plansee Seminar, Reutte/Tirol, 28.5. - 1.6.2001 
 +\\ 
 +
 +
 +\\
 +
 +
 +80 **
 +Dielectric relaxation and charge transport mechanism in (Ba,Sr)TiO3 thin films
 +**\\
 +G. Steinlesberger (gem. mit H. Reisinger, H. Bachhofer, H. Schroeder und W. Werner)
 +\\ //
 +Int. Symp. on Integrated Ferroelectrics (ISIF 2001), Colorado Springs/USA, 12.3.2001 
 +\\ 
 +
 +
 +\\
 +
 +
 +81 **
 +The 3-Step Model in Electron Spectroscopy Revised I: Escape of Auger Electrons fromNon-Crystalline Al, Si and Cu Surfaces
 +**\\
 +J. Brenner (gem. mit W.S.M. Werner, H. Tratnik und H. St\"ori)
 +\\ //
 +7th Europ. Vacuum Conf. and 3rd Europ. Topical Conf. on Hard Coatings (EVC-7/ETCHC-3),Madrid/Spanien, 18.9.2001 
 +\\ 
 +
 +
 +\\
 +
 +
 +82 **
 +On line shape analysis in X-ray photoelectron spectroscopy (XPS)
 +**\\
 +W.S.M. Werner (gem. mit Th. Cabela, J. Zemek und P. Jiricek)
 +\\ //
 +8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA, 11.8.2000
 +\\ 
 +
 +
 +\\
 +
 +
 +83 **
 +Elastic electron reflection for determination of the inelastic mean free path (IMFP) of mediumenergy electrons in 24 elemental solids for energies between 50 and 3400 eV
 +**\\
 +Ch. Tomastik (gem. mit W.S.M. Werner, Th. Cabela, G. Richter und H. St\"ori)
 +\\ //
 +8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA, 8. - 12.8.2000
 +\\ 
 +
 +
 +\\
 +
 +
 +84 **
 +Angular distribution of surface excitations for electrons backscattered from Al and Si surfaces
 +**\\
 +W. Smekal (gem. mit W.S.M. Werner, Th. Cabela, Ch. Eisenmenger-Sittner and H.St\"ori)
 +\\ //
 +8th Int. Conf. on Electron Spectroscopy and Structure (ICESS 8), Berkeley/USA,8. - 12.8.2000 
 +\\ 
 +
 +
 +\\
 +
 +
 +85 **
 +Adaptive deconvolution of Auger electron spectra
 +**\\
 +J. Brenner (gem. mit Ch. Tomastik, W.S.M. Werner und H. St\"ori)
 +\\ //
 +8th Joint Vacuum Conf. of Croatia, Austria, Slovenia and Hungary (JVC-8), Pula/Kroatien,4. - 8.6.2000 
 +\\ 
 +
 +
 +\\
 +
 +
 +86 **
 +Auger Voltage Contrast (AVC) for two-dimensional junction delineation
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Asian Pacific Conf. on Surface and Interface Analysis, Singapore, 8.12.1998
 +\\ 
 +
 +
 +\\
 +
 +
 +87 **
 +Inverse Modellierung in der Elektronenstrahl-Mikroanalyse
 +**\\
 +H.W. Wagner, W.S.M. Werner (gem. mit H. St\"ori)
 +\\ //
 +48. Jahrestagung der ÷sterr. Physikalischen Gesellschaft (÷PG), Graz, 16.9.1998 
 +\\ 
 +
 +
 +\\
 +
 +
 +88 **
 +Experimente zur Ermittlung der Austrittwahrscheinlichkeit der Elektronen bei TEY
 +**\\
 +H. Ebel, R.Svagera, M.F. Ebel, W.S.M.Werner and M. LIndner.
 +\\ //
 +47 Jahrestagung der ˜PG, Wien, ˜sterreich, September 1997
 +\\ 
 +
 +
 +\\
 +
 +
 +89 **
 +Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.
 +**\\
 +W.S.M.Werner, H.Lakatha,H.Smith, L.LeTarte,V.Ambrose and J. Baker.
 +\\ //
 +Workshop on 2-D Dopant Profiling, Triangle Research Park, NC, USA, April 1997.
 +\\ 
 +
 +
 +\\
 +
 +
 +90 **
 +Transport geladener Teilchen in Festkˆrpern
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Gesellschaft f¸r Strahlenforschung, Oberschleiflheim/D, 17.12.1997
 +\\ 
 +
 +
 +\\
 +
 +
 +91 **
 +Quantitation of Electron Spectroscopic Techniques
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, National Institute of Standards and Technology (NIST), Gaithersburg/USA,10.11.1997
 +\\ 
 +
 +
 +\\
 +
 +
 +92 **
 +Transport of Electrons in Solids for Quantitative Surface Analysis
 +**\\
 +Wolfgang S.M. Werner
 +\\ //
 +Seminarvortrag, Lawrence Berkely Lab. for Materials Science, Berkeley/USA, 3.11.1997
 +\\ 
 +
 +
 +\\
 +
 +
 +93 **
 +Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.
 +**\\
 +W.S.M.Werner.
 +\\ //
 +AVS Symposium, Philadelphia, US, Nov 1996.
 +\\ 
 +
 +
 +\\
 +
 +
 +94 **
 +Selfconsistent Calibration of TixC1-x Auger spectra.
 +**\\
 +P.M.J.Schm\"olz, W.S.M.Werner, H. Wagner, H.S\"ori and J.  Kiefer. 
 +\\ //
 +AVS Symposium, Philadelphia, US, Nov 1996.
 +\\ 
 +
 +
 +\\
 +
 +
 +95 **
 +High Precision Determination of Layer Thicknesses by XRF, EPMA, TEY and AAS.
 +**\\
 +J. Wernisch, H. Ebel, R. Svagera, R. Kaufmann, N. Zagler,  N. Kugler, H. Nguyen, M. Mantler and W.S.M.Werner.
 +\\ //
 +AAXA Sydney 96, Sydney, Australia,Jan. 1996
 +\\ 
 +
 +
 +\\
 +
 +
 +96 **
 +A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.
 +**\\
 +H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner,  H.St\"ori and M.Gr\"oschl. 
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995
 +\\ 
 +
 +
 +\\
 +
 +
 +97 **
 +Separation of the Contribution of n-fold Inelastically Scattered Electrons fromAuger Spectra of Thin Gold Films on Platinum.
 +**\\
 +W.S.M.Werner.
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995. 
 +\\ 
 +
 +
 +\\
 +
 +
 +98 **
 +Efficient Calculation of Photoelectron Angular Distribution.
 +**\\
 +W.S.M.Werner, I.S.Tilinin and A.Jablonski.
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995. 
 +\\ 
 +
 +
 +\\
 +
 +
 +99 **
 +Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.
 +**\\
 +W.S.M.Werner.
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Montreux, Switzerland, 1995.
 +\\ 
 +
 +
 +\\
 +
 +
 +100 **
 +Comparison of simulated and experimental Auger intensities of Au, Pt, Ni and Si in absolute units. 
 +**\\
 +H.Wagner, C.Schiebl and W.S.M.Werner.
 +\\ //
 +4th European Microbeam Analysis Workshop (EMAS), St. Malo, France, 1995.
 +\\ 
 +
 +
 +\\
 +
 +
 +101 **
 +Monte Carlo simulation of electron scattering for arbitrary 2D structures using a modified quadtree geometry discretization. 
 +**\\
 +H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.
 +\\ //
 +4th European Microbeam Analysis Workshop (EMAS),  St. Malo, France, 1995.
 +\\ 
 +
 +
 +\\
 +
 +
 +102 **
 +Comparison of Angle Resolved XPS and AES with Depth Profile Restoration from Inelastic Background Analysis
 +**\\
 +W.S.M.Werner and I.S.Tilinin.
 +\\ //
 +40th Symposium  of the American Vacuum Society (AVS), Orlando, Florida, USA, 1993. 
 +\\ 
 +
 +
 +\\
 +
 +
 +103 **
 +Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron  Energy Loss Spectra (REELS) of polycrystalline Al, Ni, Pt and Au.
 +**\\
 +W.S.M.Werner and M.Hayek
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Catania, Italy, 1993. 
 +\\ 
 +
 +
 +\\
 +
 +
 +104 **
 +Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and Al determined  by Elastic Peak Electron Spectroscopy.
 +**\\
 +H.Beilschmidt,  I.S.Tilinin and W.S.M.Werner
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA),  Catania, Italy, 1993
 +\\ 
 +
 +
 +\\
 +
 +
 +105 **
 +Relevance of Transport Processes for AES and XPS: Generalized Radiative FieldSimilarity Principle.
 +**\\
 +W.S.M.Werner and I.S.Tilinin,
 +\\ //
 +8th International Vacuum Congress, (IVC),  The Hague, The Netherlands, 1992
 +\\ 
 +
 +
 +\\
 +
 +
 +106 **
 +New Formalism for Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.
 +**\\
 +W.S.M.Werner and H.St\"ori.
 +\\ //
 +European Conference on Applied Surface and Interface Analysis (ECASIA), Budapest, Hungary, 1991.
 +\\ 
 +
 +
 +\\
 +
 +
 +107 **
 +Electron Attenuation Data for 45 Elements.
 +**\\
 +W.S.M.Werner.
 +\\ //
 +3rd European Vacuum Congress (EVC),  Vienna, Austria.
 +\\ 
 +
 +
 +\\
 +
 +
 +108 **
 +On  the Influence of Elastic Scattering on X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).
 +**\\
 +W.S.M.Werner.
 +\\ //
 +Symposium on Surface Science (3S),  Obertraun, Austria, 1991 
 +\\ 
 +
 +
 +\\
 +
 +
 +109 **
 +On the Effect of Elastic Scattering on the Attenuation of Auger and Photoelectrons in Films with thin Overlayers.
 +**\\
 +W.S.M.Werner
 +\\ //
 +European Conference on Surface Science (ECOSS), Salamanca, Spain, 1990 
 +\\ 
 +
 +
 +\\
 +
 +
spt/group/werner/list_of_lectures.txt · Last modified: 2017-01-12 15:45 by Wolfgang Werner