Zinc oxide (ZnO) is an important material in heterogeneous catalysis and has recently attracted interest as a wide band-gap semiconductor for electro-optical devices. The surfaces and interfaces of ZnO are critical for understanding the mechanistics of surface chemical reactions and for the fabrication of high quality hetero- and homoepitaxial films with long-term stability. The surfaces of the main low-index planes, i.e., surfaces with (0001), (000-1), (10-10), (11-20) and (11-21) orientations are characterized with high-resolution scanning tunneling microscopy and compared to first-principles total-energy calculations.
Corresponding author: U. Diebold (diebold).
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